Non-contact micro displacement measuring device and method based on linear array CCD (charge coupled device)
A technology of micro-displacement and measurement methods, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of not supporting multiple stations, measurement data cannot be transmitted over long distances, and inconvenient expansion, etc., to achieve fast transmission rate and easy expansion The effect of long-distance application and data transmission
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[0031] A device for measuring displacement and deformation includes a horizontal line laser source U1 for providing a horizontal line laser beam, a multi-channel measuring unit, a communication module U5 for data reception and control command issuing, and computer control software U6; among them: Each measurement unit includes a linear array CCD U2, a data acquisition module U3 for data acquisition and processing, and a protocol conversion module U4 for transmission and communication.
[0032] The data acquisition card module U3 includes the primary signal conditioning P1, the central processing unit P2 and the off-chip storage unit P3. The primary signal conditioning unit P1 is mainly composed of a digital potentiometer, a threshold regulator and a programmable logic device. The output voltage of the digital potentiometer is used as the threshold voltage of the threshold regulator, and the output voltage of the digital potentiometer is controlled by the programmable logic device....
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