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Non-contact micro displacement measuring device and method based on linear array CCD (charge coupled device)

A technology of micro-displacement and measurement methods, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of not supporting multiple stations, measurement data cannot be transmitted over long distances, and inconvenient expansion, etc., to achieve fast transmission rate and easy expansion The effect of long-distance application and data transmission

Inactive Publication Date: 2013-10-30
NORTHWEST INST OF NUCLEAR TECH
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Problems solved by technology

[0005] The purpose of the present invention is to provide a real-time measurement and display, maximum support of 256 nodes, measurement parameters can be set, data can be transmitted over a long distance, a non-contact micro-displacement measurement device and method based on a linear array CCD, which solves the problems of existing methods and The device is not easy to expand, does not support multi-station, measurement data cannot be transmitted over long distances and other technical problems

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  • Non-contact micro displacement measuring device and method based on linear array CCD (charge coupled device)
  • Non-contact micro displacement measuring device and method based on linear array CCD (charge coupled device)
  • Non-contact micro displacement measuring device and method based on linear array CCD (charge coupled device)

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Embodiment Construction

[0031] A device for measuring displacement and deformation includes a horizontal line laser source U1 for providing a horizontal line laser beam, a multi-channel measuring unit, a communication module U5 for data reception and control command issuing, and computer control software U6; among them: Each measurement unit includes a linear array CCD U2, a data acquisition module U3 for data acquisition and processing, and a protocol conversion module U4 for transmission and communication.

[0032] The data acquisition card module U3 includes the primary signal conditioning P1, the central processing unit P2 and the off-chip storage unit P3. The primary signal conditioning unit P1 is mainly composed of a digital potentiometer, a threshold regulator and a programmable logic device. The output voltage of the digital potentiometer is used as the threshold voltage of the threshold regulator, and the output voltage of the digital potentiometer is controlled by the programmable logic device....

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Abstract

The invention provides a non-contact micro displacement measuring device and method based on a linear array CCD (charge coupled device). Laser emitted by a horizontal linear laser is irradiated on the linear array CCD, and a light sensing pixel outputs a signal under the action of a drive pulse; when the output signal exceeds a set background threshold voltage, a threshold comparator outputs rectangular pulse strings; and after the rectangular pulse strings at different moments are processed, the central positions of the rectangular pulse strings are respectively obtained, thus obtaining the absolute displacement of the linear array CCD between different moments. The number of rectangular pulse signals output by a threshold adjuster is determined by the comparison result of the threshold voltage and the output signal voltage of the linear array CCD; and a central processing unit is mainly used for concerning the number of the rectangular pulse signals output by the threshold adjuster, therefore the device provided by the invention facilitates the process control regulation, is high in precision and small in noise, can store optimal operating point data output by a digital potentiometer, and provides data supports for regulating the output of the digital potentiometer in different environments.

Description

Technical field [0001] The invention relates to a measuring device and method, a device and method for real-time monitoring of the small displacement or deformation of a device to be measured, and in particular to a data acquisition system and channel expansion technology of the measuring device. Background technique [0002] The measurement of displacement and deformation is playing an increasingly important role in many application fields such as surface measurement, material measurement, and precision mechanical measurement. To measure displacement or deformation, contact measurement method and non-contact measurement method can be used. The traditional contact measurement method has many limitations, it is difficult to achieve high-precision detection of small displacement; non-contact measurement method has the characteristics of simple device structure, fast speed, high measurement accuracy, convenient and flexible application, etc. It is currently used widely. [0003] Mos...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02G01B11/16
Inventor 阮林波李海涛田耕渠红光王晶霍宏发
Owner NORTHWEST INST OF NUCLEAR TECH
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