Semiconductor refrigeration sampling device for ceiling test

A sampling device and semiconductor technology, applied in measurement devices, sampling devices, instruments, etc., can solve problems such as affecting analysis results, decreasing adsorption effect, and unsatisfactory analysis effect, achieving good chemical stability, easy control, and convenient refrigeration. effect of speed

Inactive Publication Date: 2012-05-02
SHANGHAI RES INST OF CHEM IND
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The currently used adsorption sampling requires an atmospheric sampler and an adsorption tube, and it takes a long time to collect during use, usually more than 2 hours. At the same time, if the adsorbent reaches adsorption saturation, the adsorption effect will decrease
[0004] At the same time, the adsorbed sample needs to be heated and analyzed before analysis. If the analysis effect is not ideal, the analysis result will be affected.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor refrigeration sampling device for ceiling test
  • Semiconductor refrigeration sampling device for ceiling test

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0027] A semiconductor refrigeration type headspace test sampling device, its structure is as follows figure 1 As shown, the sampling device includes an air extraction pump 1, a sampling line 2, a temperature probe 3, a headspace bottle 4, a heat sink 6, a semiconductor cold stack 7, a heat dissipation component 8, and a fan 9, an air extraction pump 1, a sampling line 2, and a headspace The bottle 4 constitutes a sampling path, the radiator plate 6, the semiconductor cold stack 7, the heat dissipation group 8 and the fan 9 constitute the refrigeration path. Among them, the air pump 1 is connected to the headspace bottle 4 through a pipeline, and the headspace bottle 4 is placed in the headspace bottle. In assembly 5, part of the sampling pipeline 2 is set in the headspace bottle placement assembly 5, and the other part exposes the upper end of the headspace bottle placement assembly 5. The temperature probe 3 is set on the upper part of the headspace bottle placement assembly 5...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a semiconductor refrigeration sampling device for a ceiling test. The sampling device comprises a sucking pump, a sampling pipeline, a temperature probe, a ceiling bottle, a radiating plate, a semiconductor cooler, a radiating component and a fan, wherein the sucking upm, the sampling pipeline and the ceiling bottle form a sampling channel; the radiating plate, the semiconductor cooler, the radiating component and the fan form a refrigeration channel; and the semiconductor cooler provides a cold source. Compared with the prior art, the sampling device has the advantages that: the size is mall, the weight is light, a mechanical transmission part is not arranged, the refrigeration rate can be convenient to adjust by adjusting working current, the service life is long, the controllability is high, the environmental properties are high, the economy is good and the like.

Description

Technical field [0001] The invention relates to a sampling device, in particular to a semiconductor refrigeration type headspace test sampling device. Background technique [0002] Anything with explosive, flammable, poisonous, corrosive, radioactive and other dangerous properties that can cause burning or explosion under certain conditions during transportation, loading and unloading, production, use, storage, and storage, resulting in accidents such as personal injury and death and property loss Chemicals are collectively referred to as chemical dangerous goods. With the development of science and technology, people are becoming more and more aware of the safety of the production environment and living environment. More and more attention is paid to environmental protection. Environmental protection and safety have been paid attention to by government departments at all levels, enterprises and institutions. The relevant policies, regulations, and standards are becoming more an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/24G01N30/16
Inventor 张小沁刘刚薛晓康林建王露
Owner SHANGHAI RES INST OF CHEM IND
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap