Program-controlled LED aging test apparatus
An aging test and program-controlled technology, which is used in lamp testing, single semiconductor device testing, etc., can solve problems such as lack of systematic research on device failure mechanisms, product damage, electrical performance stability, light and color performance attenuation consistency, and service life.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Such as figure 1 , The LED electrical characteristic detector includes a sequentially interconnected PC 1 , a program-controlled aging power supply 2 and an aging tooling fixture 3 . PC 1 realizes the setting of relevant aging parameters, storage of production data, statistical analysis of product quality data, and generation of analysis reports. It has intelligent functions such as self-maintenance, self-calibration, and fault alarm. The software system is man-machine friendly, intuitive and easy to use. Program-controlled aging power supply 2 provides aging working power for LEDs to be aged. The fixture 3 realizes reliable clamping of the LED to be aged.
[0031] Such as figure 2 , Program-controlled aging power supply 2 includes: microprocessor module 2-1, device working power supply module 2-2, power output power supply module 2-3, current / voltage adjustment module 2-4, D / A conversion module 2-5, temperature Detection and alarm module 2-6, keyboard module 2-7, L...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com