Transmission device for testing capacity of phase noise measuring system

Abstract

The invention relates to a transmission device for testing capacity of a phase noise measuring system. The transmission device comprises a first high-stability crystal oscillator and a second high-stability crystal oscillator, wherein the first high-stability crystal oscillator is connected to a microwave phase detecting port through a first gating switch via a first frequency multiplier, a firstphase-locked loop, a first low-noise voltage-controlled oscillator, a first isolation amplifier, a second frequency multiplier, a first comb-spectrum generator, a first comb filter, a first power amplifier and a first microwave source; the first isolation amplifier is also connected with the first phase-locked loop; the second high-stability crystal oscillator is connected with the microwave phase detecting port through a second gating switch via a second frequency multiplier, a second phase-locked loop, a second low-noise voltage-controlled oscillator, a second isolation amplifier, a fourth frequency multiplier, a second comb-spectrum generator, a second comb filter, a second power amplifier and a second microwave source; and the second isolation amplifier is also connected with the second phase-locked loop. The transmission device disclosed by the invention has important significance for enhancing the testing proficiency of the phase noise measurement.

Description

technical field [0001] The invention relates to a transfer device of a measurement system, in particular to a transfer device applied to the capability verification of a phase noise measurement system. Background technique [0002] The current phase noise measurement devices on the market mainly include the imported HP3047A, HP3048A, E5500 series and PN9000, etc. The components of these devices mainly include phase detectors, phase-locked loops, low-noise amplifiers, data acquisition and computers. [0003] For such a large, precise, and complex measurement system, there is no value transfer standard at home and abroad, only functional testing of the system. However, when measuring the same transfer standard, there may be large dispersion in the phase noise measurement results obtained by different phase noise measurement systems. In the past, the comparison measurement of phase noise parameters was carried out to solve the problem that the phase noise measurement system ca...

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Problems solved by technology

[0004] This comparison sample has the following shortcomings. One is that the 10MHz crystal oscillator used to verify the performance index of the "phase noise measurement system" in the low-end frequency range has a voltage control sensitivity of 100Hz / V due to its wide selection of voltage control characteristics. As a result, in the comparison measurement process, the loop setting is too large, and the measurement results in the frequency range of 0.1Hz to 1Hz Fourier analysis near the carrier frequency have large dispersion

The second is the 10GHz microwave source used to verify the high-end frequency range performance index of the "Phase Noise Measurement System". The measurement results in the Fourier analysis frequency range of ~100Hz show a large dispersion. On the other hand, because the noise at the Fourier analysis frequency of 1Hz has exceeded the small-angle modulation condition, the measurement results here can no longer be used as SSB phase Noise measurement results using

The third is that there is only one 10GHz microwave source to verify the high-end frequency range performance index of the "phase noise measurement system". During the comparison process, the method of down-conversion can only be used for measurement. The microwave phase detection port is directly calibrated. On the other hand, due to the introduction of a down-converter and an intermediate frequency reference source, the comparative measurement results within the Fourier analysis frequency range of 100Hz to 10kHz have large dispersion.

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