Method and device for enriching and sampling xenon in atmosphere at low temperature

Abstract

The invention relates to a method and device for enriching and sampling xenon in atmosphere at low temperature. The method comprises the following steps of: enriching the xenon in the atmosphere at low temperature, and realizing enrichment concentration of the xenon by using four levels of adsorbing columns at the same time and removing other impurities synchronously. According to the method for enriching and sampling the xenon in the atmosphere at low temperature, disclosed by the invention, active carbon serves as an adsorbing agent, thus the complexity and the realization difficulty of the method are reduced, and no spare time exists; in addition, the device disclosed by the invention can be used for carrying out continuous sampling and has a simple structure; and the method disclosed by the invention is simple and convenient, and is large in sampling amount.

Description

technical field [0001] The invention belongs to a nuclear environment monitoring method, in particular to the enrichment and separation of xenon, a rare gas in the atmosphere. Background technique [0002] Radionuclide monitoring technology is one of the four key verification technologies stipulated in the Comprehensive Nuclear-Test-Ban Treaty (CTBT). The characteristic radionuclides produced and released by nuclear activities play a decisive role in the qualitative identification of suspicious events in CTBT verification. The sampling and analysis technology for these nuclides has always been the focus of radionuclide monitoring technology research. The radioactive noble gases of interest in the international radionuclide monitoring system are radioactive xenon isotopes (mainly including 131m Xe, 133m Xe, 133 Xe, 135 Xe). [0003] The volume fraction of the rare gas xenon in the air is 8.7×10 -8 (v / v), in which the content of radioactive xenon isotopes is lower and di...

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Problems solved by technology

[0004] Literature search information: Invented by Zhou Chongyang and others in the 63653 Army of the Chinese People's Liberation Army, the patent No. CN201728039U "A Separation Device for Enriching Gas Xenon" uses a first-level 5A molecular sieve impurity removal column, a first-level activated carbon adsorption column, and a second-level 5A Molecular sieve plus activated carbon impurity removal column, secondary activated carbon adsorption column, third-stage 5A molecular sieve plus activated carbon impurity removal column, and third-stage activated carbon adsorption column to enrich and separate xenon. A total of 6 adsorption columns are used, involving 2 types and 2 specifications each Adsorbent, and continuous sampling cannot be achieved

Another invention by Zhou Chongyang and others, the patent No. CN 101985080 A "A Method for Enrichment and Separation of Xenon Using Activated Carbon", can only process xenon standard gas with a concentration of 10-1000ppm, and cannot directly sample from the air

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