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Data collecting device for micro tester

A technology of data acquisition and tester, which is applied in the direction of instruments, etc., can solve problems such as difficulty in mass production, long calibration time, and low efficiency, and achieve high production efficiency, simple operation, and good scalability

Inactive Publication Date: 2012-08-08
无锡永阳电子科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the calibration and correction methods of sensors can only be carried out individually, and batch calibration and correction of sensors cannot be realized, which makes the calibration time long and the efficiency is extremely low, making it difficult to meet the needs of mass production

Method used

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  • Data collecting device for micro tester

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Embodiment Construction

[0010] Such as figure 1 Shown, the micro-tester data acquisition device of the present invention comprises PXI system, switch switching circuit, baking oven, pressure controller, controller / host, communication board and power supply, and described PXI system is made of single pole single throw switch, single pole double throw Composed of switches, matrix switches, digital multimeters, digital converters and multi-system expansion interfaces, the switch switching circuit is composed of switch connectors, voltage and current connectors, digital converter connectors, communication board connectors, power supply connectors and cable connectors; there are sensors in the oven adapters and sensors. The single-pole single-throw switch, single-pole double-throw switch, and matrix switch in the PXI system are connected to the switch connector of the switch switching circuit through cables, the digital multimeter is connected to the voltage and current connector of the switch switching c...

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Abstract

The invention discloses a data collecting device for a micro tester. The data collecting device comprises a PXI (PCI extensions for instrumentation) system, a switch converting circuit, an oven, a pressure controller, and a controller / host. The PXI system consists of a single-pole single-throw switch, a single-pole double-throw switch, a matrix switch, a digital multi-meter, a digital converter and a plurality of system expansion interfaces; and a sensor adapter and a sensor are arranged in the oven. The PXI system is connected with the switch converting circuit through a cable; the switch converting circuit is connected with the sensor adapter in the oven through the cable; the sensor in the oven is connected with the pressure controller; the controller / host is respectively connected with the PXI system, the switch converting circuit, the oven, the sensor in the oven, a power supply source and the pressure controller. The sensor is calibrated and corrected by using the data collecting device provided by the invention with high efficiency, so as to meet the requirement of mass production. The data collecting device provided by the invention is applicable to data collection when a sensor precision test is carried out.

Description

technical field [0001] The invention relates to a data acquisition device. Specifically, it is a data acquisition system for sensor accuracy testing. Background technique [0002] It is known in the field of electronics that with the continuous development of science and technology, there are more types of sensors and more and more application fields, such as automobiles, construction machinery, aviation, medical electronics, etc. And these fields have extremely high requirements on the accuracy of sensors. For example, the acceleration sensor of a car must be able to detect in time when a car accident occurs, and immediately open the airbag to ensure the personal safety of the driver. Therefore, before the sensor is put into application, it must be calibrated and corrected so that its output signal is as close to the ideal output signal as possible. [0003] At present, the calibration and correction methods of sensors can only be carried out individually, and batch calib...

Claims

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Application Information

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IPC IPC(8): G01D18/00
Inventor 朱荣惠郝晓卿
Owner 无锡永阳电子科技有限公司
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