Device for electrically transiently measuring thermo-physical properties of materials and method
A thermophysical property and transient technology, applied in the direction of material resistance, can solve the problems of difficult and accurate temperature measurement
Inactive Publication Date: 2012-08-15
陈昭栋
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Problems solved by technology
However, due to the difficulty of measuring temperature, it is difficult to be accurate to the level of 1% degree
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[0050] The present invention will be described in detail below in conjunction with specific embodiments.
[0051] refer to figure 1 and figure 2 , the device for transiently measuring thermal properties of materials by electrical method includes a probe, a DC ammeter, a voltage acquisition module, a data processing module and a DC steady-current power supply;
[0052] Such as figure 1 As shown, it is a schematic diagram of the probe structure; the radius of the probe is set to r, and the thickness can be ignored. The probe is a heating element and a voltage acquisition and measurement element. The probe includes a double-helix metal nickel film 10, a lead wire nickel film 12 and an insulating protective film 11; the radius of the double-helix metal nickel film 10 is r≈11mm, and the resistance R≈36Ω of the double-helix metal nickel film 10; the double-helix metal The thickness of the nickel film 10 is δ≈0.08-0.20mm. The double-helix metal nickel film 10 is attached to the i...
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Abstract
The invention discloses a method for electrically transiently measuring thermo-physical properties of materials and a device. The device comprises a probe, direct-current ammeters, a voltage acquisition module, a data processing module and a direct-current stabilized current supply, wherein the probe consists of a double-spiral-line metal nickel membrane, outgoing-line nickel membranes and an insulating protective membrane, the double-spiral-line metal nickel membrane is attached onto the insulating protective membrane, the two outgoing-line nickel membranes are respectively connected to two ends of the double-spiral-line metal nickel membrane, the two direct-current ammeters are serially connected into the two outgoing-line nickel membranes of the probe and used for displaying direct-current passing through the probe, the voltage acquisition module is connected onto outgoing lines of the probe in parallel, and the data processing module is used for processing data acquired by the voltage acquisition module. An electric measurement method is adopted, namely the thermo-physical properties of the materials are measured by means of measuring electrical quantities. The novel measurement instrument is developed by the aid of electrical transient automatic measurement technology for detecting thermo-physical properties of wafers, rare and tiny materials, precious metal materials, micro-electronic and micro-optic materials and the like.
Description
technical field [0001] The invention relates to a device and method for transiently measuring thermal properties of materials by electrical method. Background technique [0002] As we all know, the thermal physical properties of materials such as thermal conductivity and thermal diffusivity vary with the material, the structure, density, porosity, electrical conductivity, and moisture content of the material, and some materials are also related to the direction; usually, these Performance is also affected by temperature and pressure. Corresponding to different materials and different experimental conditions, measuring the thermophysical properties of materials is of vital significance in scientific research and engineering technology; thermophysical property measurement is the same as mechanical measurement, electrical measurement, optical measurement, etc. One of the basic measurement techniques studied. [0003] The measurement of thermal physical properties of materials...
Claims
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IPC IPC(8): G01N27/14
Inventor 陈昭栋陈丕陈芬
Owner 陈昭栋