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Method for making semiconductor built-in stress nanowire and semiconductor device

A semiconductor and nanowire technology, applied in the field of semiconductor device production technology, can solve the problem that the reverse built-in stress of semiconductor nanowires is not in the horizontal direction, and achieve the effect of avoiding dislocation

Active Publication Date: 2015-12-02
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] What the present invention aims to solve is the problem that the reverse built-in stress of semiconductor nanowires is not in the horizontal direction in the prior art (such as US2011 / 0104860A1)

Method used

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  • Method for making semiconductor built-in stress nanowire and semiconductor device
  • Method for making semiconductor built-in stress nanowire and semiconductor device
  • Method for making semiconductor built-in stress nanowire and semiconductor device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0061] step 1,

[0062] Such as figure 1 As shown, a semiconductor substrate with a buried oxide layer is provided. Preferably, the substrate is an SOI silicon wafer, including a buried oxide layer 1 and a top semiconductor layer 2 (silicon layer).

[0063] Preferably, the buried oxide layer has a thickness of 10 nm to 1000 nm, and the top semiconductor layer has a thickness of 10 nm to 200 nm.

[0064] The top semiconductor layer 2 originally contains impurity ions, which are used as channel doping ions of the subsequent NWFET.

[0065] step 2

[0066] Such as Figure 2A and Figure 2B As shown, the preparation region of semiconductor nanowire field effect transistor (NanowireFET, NWFET) is determined on the top semiconductor layer 2, and the PR mask 3 is covered on the preparation region of the semiconductor nanowire field effect transistor, and the top semiconductor layer 2 is processed. Photolithography, the top semiconductor layer 2 covered with the PR mask 3 forms ...

Embodiment 2

[0079] step 1,

[0080] Such as figure 1 As shown, a semiconductor substrate with a buried oxide layer is provided. Preferably, the substrate is an SOI silicon wafer, including a buried oxide layer 1 and a top semiconductor layer 2 (silicon layer).

[0081] Preferably, the buried oxide layer has a thickness of 10 nm to 1000 nm, and the top semiconductor layer has a thickness of 10 nm to 200 nm.

[0082] Ion implantation is performed in the top semiconductor layer 2 to include impurity ions as channel dopant ions of the subsequent NWFET.

[0083] step 2

[0084] Determine the preparation area of ​​the semiconductor nanowire field effect transistor (NanowireFET, NWFET) on the top semiconductor layer 2, cover the hard mask on the preparation area of ​​the semiconductor nanowire field effect transistor, etch the top semiconductor layer 2, cover The top semiconductor layer 2 with a hard mask forms the preparation area of ​​the semiconductor nanowire field effect transistor, the...

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Abstract

The invention provides a method for manufacturing a built-in stress nanowire and a semiconductor device and a nanowire field effect transistor (NWFET) semiconductor device manufactured by using the method. The method uses a gate-last process (Gate-last), the lateral face of an NWFET area is protected through an amorphous carbon layer when a grid electrode area is etched, the reverse stress direction borne by the nanowire (NW) of the grid electrode area is in the horizontal direction at the time so that problems in the United States US2011 / 0104860A1 are effectively solved, namely the problem that reverse built-in stress of the semiconductor nanowire is not in the horizontal direction is avoided, disposition which possibly occurs on the middle portion of the semiconductor nanowire is avoided, and even the breaking problem can be solved.

Description

technical field [0001] The invention relates to a production process of a semiconductor device, in particular to a method for manufacturing a built-in stress nanowire and a method for manufacturing an NWFET semiconductor device. Background technique [0002] At present, it is very common to introduce strain engineering in the manufacture of advanced semiconductor devices. For a MOSFET whose channel direction is <110>, when the channel direction has tensile stress, it can effectively increase the current driving capability of the NMOSFET. When the direction has compressive stress, the current driving capability of the PMOSFET can be effectively increased. [0003] In the same way, for the most advanced semiconductor nanowire field effect transistor (Nanowire Field Effect Transistor, NWFET), if strain engineering is introduced in the direction of the nanowire length (ie, the channel direction), the current driving capability of the NWFET will also be greatly increased. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/335H01L29/775B82Y10/00
Inventor 黄晓橹刘格致
Owner SHANGHAI HUALI MICROELECTRONICS CORP