Prediction method for q-precentile life of intelligent meter

Abstract

The invention discloses a prediction method for the q-precentile life of an intelligent meter and relates to the technical field of reliability estimation of accelerated degradation data. The method comprises the following steps: performing degradation path modeling according to test data, and obtaining the pseudo life estimation of the intelligent meter under all stress levels according to the failure threshold value of given parameters; building a Weibull distribution-based accelerated degradation model of three parameters, such as temperature, humidity and electrical stress according to the pseudo life estimation results of the intelligent meter under all stress levels of an accelerated degradation test, so as to obtain the point estimation and covariance estimation of the acceleration model; and obtaining the lower estimation of parameter service life of the intelligent meter under a given reliability degree and a given confidence degree in normal use conditions according to the point and covariance matrix of the parameters of the accelerated degradation model. Due to the adoption of the method, the test time is effectively shortened, the test expense is reduced, and the quick and accurate estimation of a stable period of an accelerometer is realized.

Description

technical field [0001] The invention relates to the technical field of reliability evaluation of accelerated degradation data, in particular to a method for predicting the reliable life of an intelligent electric meter. Background technique [0002] The energy meter is an important measuring instrument for the settlement of electric energy trade between the power generation company and the power supply company, as well as between the power supply company and the electricity customer. The measurement accuracy and operation reliability of electric energy meters have always been the focus of attention of power grid companies. [0003] With the continuous improvement of the manufacturing quality and screening process of electronic components, as well as the improvement of the design level of electronic energy meters, the reliability of domestic electronic energy meters has reached a relatively high level. As a high-end electronic energy meter that has been gradually promoted na...

AI Technical Summary

Problems solved by technology

[0005] The traditional life assessment method based on accelerated degradation test data can only give the MTBF (mean time between failures) under normal use conditions of the product or the reliable life point estimation under a given reliability

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