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Searching method for annular sub-aperture boundary splicing

A technology of annular sub-aperture and search method, which is applied in the field of full-aperture aspheric surface shape, can solve problems such as difficult extraction and uncertain sub-aperture phase information, and achieve the effects of convenient processing, easy implementation, and simple principle

Inactive Publication Date: 2012-10-17
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

[0004] In order to overcome the uncertainty of annular sub-aperture boundary positioning and the difficulty of extracting sub-aperture phase information, the present invention proposes a search method for annular sub-aperture boundary splicing. This method establishes a circular sub-aperture planning model and gives The specific solution method of the model is clarified, which provides a theoretical basis for the actual detection

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  • Searching method for annular sub-aperture boundary splicing
  • Searching method for annular sub-aperture boundary splicing
  • Searching method for annular sub-aperture boundary splicing

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Embodiment Construction

[0014] first step, such as figure 1 The schematic diagram of the aspheric device for splicing detection of annular sub-apertures is shown. According to the caliber of the parabolic mirror to be tested, the relative aperture and the resolving power of the interferometer, set the loop termination condition and the maximum deviation d that the critical point meets Boundary coincidence, when there is an overlapping area, determine the proportional relationship between adjacent annular sub-aperture boundaries according to the set overlapping coefficient ratio. Assuming that at most N fringes can be clearly distinguished, the interference wavelength is λ, R 0 is the radius of curvature of the apex of the aspheric surface, P 1 point is the critical point coordinates of the interference boundary (x 1 ,y 1 )express. like figure 2 Mathematical model of the test plane shown. Calculated as follows:

[0015] Depend on d = ( ...

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Abstract

The invention discloses a searching method for annular sub-aperture boundary splicing. The moving distance of an interferometer and sub-aperture inner and outer boundaries in a splicing experiment are positioned; the method is mainly applied to an system for measuring heavy-caliber aspherical surface shapes by a small-caliber interferometer; the method determines the sub-aperture boundary condition of a clear interference fringe and the axial moving distance of the interferometer through the measured paraboloid mirror caliber, relative aperture and CCD (charge coupled device) sampling resolution of the interferometer, and the next boundary is obtained through the circulative calculation until the suspend condition is achieved, that is, the critical point coordinate exceeds the aspherical caliber. According to the method, a sub-aperture division model is established, and a particular solving method of the model is given, thus the detection process can be controlled, quantized and can be repeated, and convenience for the treatment of the subsequent experiment data is provided.

Description

technical field [0001] The invention proposes a search method for splicing the boundaries of annular sub-apertures, which adopts the steps of successively calculating the inner and outer boundaries of the sub-apertures and the moving distance of the interferometer, and splicing a plurality of annular sub-apertures to obtain a full-aperture aspheric surface shape. This method is mainly used in measuring large-aperture aspheric surface shape systems with small-aperture interferometers. Background technique [0002] After years of development of aspheric surface detection technology, many detection methods have appeared, such as compensation method, holography method, shearing interference method, imageless point detection method, sub-aperture splicing method. Considering generality, processing cost, processing cycle, processing technology and other factors, the sub-aperture splicing technology is an effective means to measure rotationally symmetrical large-aperture aspheric mi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 惠梅段磊龚诚赵跃进
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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