Double-closed-loop testing device for intelligent substation and control method thereof

Abstract

The invention discloses a double-closed-loop testing device for an intelligent substation. The double-closed-loop testing device is characterized by comprising a main control board unit, a digital / analog conversion unit, a power amplification unit, a feedback loop switching unit, an analog / digital conversion unit, a liquid crystal display unit, a network communication unit and a power supplying unit which provides different voltages for various units of the device. The device is combined with an upper computer software platform and a master clock, and the connecting reliability of secondary equipment of the substation such as a merging unit, a network switch, a relay protection device, a measurement control device, a safety control device, a metering device and a background monitoring system and the configuration accuracy can be tested. The device is provided with two closed loops, wherein by one closed loop for correcting zero drift of the units of the device, the degree of automation is increased, the workload of debugging personnel for the device is reduced, the maintenance of the device is reduced, and the field debugging personnel of the intelligent substation can correct the system error before an experiment; and by the other closed loop, the output quantity of the double-closed-loop testing device can be monitored in real time, and the output waveform in a steady state is corrected according to a detection value.

Description

technical field [0001] The invention relates to the field of testing and testing of intelligent substations, in particular to a double-closed-loop testing device and control method for intelligent substations. Background technique [0002] The smart grid is developing rapidly. According to the plan of the State Grid Corporation of my country, a large number of smart substations will be built in China. However, the test methods on the secondary side of the old smart substations can no longer meet the requirements, and a new test method needs to be explored. First of all, the existing devices do not have a closed-loop loop, only the forward path, so that the waveform sent out cannot be corrected in real time, and the waveform sent by itself cannot be observed; secondly, the existing devices do not have a closed-loop loop, only the forward path, so they cannot Automatically complete the zero drift measurement of the power amplifier unit, which requires regular manual measuremen...

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Problems solved by technology

[0002] The smart grid is developing rapidly. According to the plan of the State Grid Corporation of my country, a large number of smart substations will be built in China. However, the test methods on the secondary side of the old smart substations can no longer meet the requirements, and a new test method needs to be explored.

First of all, the existing devices do not have a closed-loop loop, only the forward path, so that the waveform sent out cannot be corrected in real time, and the waveform sent by itself cannot be observed; secondly, the existing devices do not have a closed-loop loop, only the forward path, so they cannot Automatically complete the zero drift measurement of the power amplifier unit, which requires regular manual measurement; again, in existing devices, such as relay protection testers, the number of channels is limited, and relay protection tests can only be performed on a single protection device or 2-3 protection devices , cannot test all the circuits on the secondary side at the same time; so it needs to be improved

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