Method for measuring dielectric loss by utilizing pulse response time of electromagnetic evanescent wave irradiance
A technique of impulse response and dielectric loss, which is applied in the measurement of phase influence characteristics, measurement devices, and material analysis using microwave means. It can solve problems such as difficult and impossible accurate measurement and achieve the effect of accurate measurement
Active Publication Date: 2014-07-30
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
View PDF7 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, when the absorption of the medium is very weak, that is, when n" is very small, the change of the amplitude of the transmitted wave will also be very small, so it is very difficult to measure n" with the transmitted wave, and it is even impossible to measure it accurately
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0025] see figure 1 As shown, the method for measuring the dielectric loss using the pulse response time of the electromagnetic evanescent wave irradiance of the present invention at least includes the following steps:
[0026] First, determine the real part n' of the refractive index of the medium to be measured within the preset frequency range 2 , and define the medium to be tested as an optically rarefied medium. What we need to measure is the imaginary part of the refractive index n″ of the medium to be measured 2 . If the medium to be measured is a dispersive medium, then n' 2 and n″ 2 It is related to the frequency of electromagnetic waves. Usually, the preset electromagnetic wave frequency range can be visible light, infrared light or microwave, etc.
[0027] Next, find an optically dense medium (the refractive index n of the medium 1 is known and greater than the real part n′ of the refractive index of the medium to be measured 2 ), and arrange the optically d...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention provides a method for measuring dielectric loss by utilizing pulse response time of electromagnetic evanescent wave irradiance. The method comprises the following steps of: 1) determining a real part of the refractive index of a medium to be measured in electromagnetic wave with preset frequency range, and defining the medium to be measured to be an optically thinner medium; 2) seeking an optically denser medium with known refractive index and the real part of the refractive index greater than that of the medium to be measured, and forming a total reflection system by the optically denser medium and the medium to be measured; 3) emitting the electromagnetic wave with preset frequency range from the optically denser medium to the medium to be measured, and adjusting the incident angle to realize the total reflection of the electromagnetic wave to at an interface of the optically denser medium and the medium to be measured and generate evanescent wave inside the medium to be measured; and 4) adjusting the power of the incident electromagnetic wave to generate little pulse, measuring the response time of the evanescent wave irradiance to the pulse, and calculating an imaginary part of the refractive index of the medium to be measured according to the pulse response time. The measuring method not only can be carried out repeatedly in a lossless way, but also can realize the measurement with ultra-high precision.
Description
technical field [0001] The invention relates to a method for measuring dielectric loss by using the pulse response time of electromagnetic evanescent wave irradiance, in particular to a method for measuring weak loss of rare gas by using the pulse response time of electromagnetic evanescent wave irradiance. Background technique [0002] Suppose the refractive index of a certain medium is n=n'+n", where n' and n" are the real part and imaginary part of the medium's refractive index respectively, and our goal is to measure n' and n". [0003] We already know that for the propagating wave, n' and n" respectively determine the real part and imaginary part of the wave vector of the propagating wave, so when the propagating wave propagates a certain distance in the medium, n' and n" respectively determine Phase change and amplitude change of the transmitted wave. Since the phase change is relatively obvious and can be accurately measured by instruments such as interferometers, ma...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/41G01N22/00
Inventor 李伟蒋寻涯
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI