Radiation-proof triple-modular redundancy circuit structure

A technology of three-mode redundancy and circuit structure, which is applied in the direction of reliability improvement and modification, can solve unrealistic problems, and achieve the effect of improving efficiency and anti-radiation performance
CN102820879AInactive Publication Date: 2012-12-1258TH RES INST OF CETC

Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
58TH RES INST OF CETC
Publication Date
2012-12-12
Estimated Expiration
Not applicable Β· inactive patent

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Abstract

The invention provides a radiation-proof triple-modular redundancy circuit structure, which is characterized in that a combined logic circuit and a time sequence logic circuit of the circuit are tripled, and a voter is added behind the three time sequence logic circuits, so that each section of route of the circuit is tripled. In addition, a voter is added respectively in each section of route, so that single-particle fault is eliminated in each section of route through a structure consisting of a redundancy route and the voter. The radiation-proof triple-modular redundancy circuit structure has the advantages that a redundancy module is used for shielding the influence of the fault on the entire circuit. The triple-modular redundancy circuit structure can be generated through relevant scripts, so that the design efficiency of the circuit is improved, and meanwhile, the radiation-proof performance of the entire circuit is greatly improved.
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Description

Technical field

[0001] The invention relates to the design of anti-spatial single-event effects of semiconductor devices, and is especially applied to integrated circuits that resist single-event effects. Background technique

[0002] With the development of science and technology, mankind will do more and more research in the space field, and the requirements for aerospace devices will become higher and higher. Among them, reliability is an important indicator of aerospace devices. The Single Event Upset (SEU) caused by high-energy particles in the space radiation environment seriously affects the reliability of spaceborne electronic systems. In particular, as the integration of semiconductor devices continues to increase, feature sizes and operating voltages continue to decrease, the critical charge required for SEU is getting smaller and smaller, and as a result, the probability of SEU occurrence is getting higher and higher. Most integrated circuits use the reinforcement des...

Claims

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