A manufacturing process of copper interconnection wire
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI HUALI MICROELECTRONICS CORP
- Publication Date
- 2015-08-19
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to the field of semiconductor manufacturing, in particular to a manufacturing process of copper interconnection wires. Background technique
[0002] As the integration level of semiconductor chips continues to increase, the feature size of transistors continues to shrink.
[0003] When the characteristic size of transistors enters the 130nm technology node, due to the high resistance of aluminum, copper interconnection gradually replaces aluminum interconnection and becomes the mainstream of metal interconnection. Now the widely used method of making copper wire is damascene technology. , in which the trench-first dual-damascene process is one of the methods to realize the one-time forming of copper wires and through-hole copper.
[0004] Figures 1a-1f It is a schematic structural flow diagram of groove priority double damascene process in the background technology of the present invention; as Figures 1a-1f As shown, after depo...