Unlock instant, AI-driven research and patent intelligence for your innovation.

Wet etching method for metal layer on front surface of high inverse-voltage Schottky diode

A Schottky diode and wet etching technology, which is applied to electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the problem of not being able to effectively take into account the over-corrosion and residue of the underlying metal layer Ti, which affects high back-voltage Schottky diodes Electrical parameter characteristics, high reverse voltage Schottky diode reverse leakage and other issues, to achieve the effect of solving over-corrosion and residue, easy operation, and good corrosion rate

Active Publication Date: 2014-12-03
HANGZHOU LION MICROELECTRONICS CO LTD
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to solve the problem that the wet etching method in the prior art has many steps and complex operation, and cannot effectively take into account the over-corrosion and residue of the underlying metal layer Ti, which may easily cause reverse leakage and early If it fails, a large amount of metal ions will remain on the substrate surface of the diode core, which will affect the electrical parameter characteristics of the high back-voltage Schottky diode. It provides a simple process step that can effectively take into account the over-corrosion and residual of the underlying metal layer Ti. , and at the same time can effectively remove the residual metal ions on the surface of the substrate, a wet etching method for the metal layer on the front of the high back-voltage Schottky diode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Wet etching method for metal layer on front surface of high inverse-voltage Schottky diode
  • Wet etching method for metal layer on front surface of high inverse-voltage Schottky diode
  • Wet etching method for metal layer on front surface of high inverse-voltage Schottky diode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0034] (1) if figure 2 As shown, a photoresist 1 with a thickness of 2 μm is coated on the surface of the front metal layer structure on the Schottky diode tube core substrate 5 that is evaporated and plated with Ti layer 4, Ni layer 3, and Ag layer 2 from bottom to top. Finally, place the tube core in a nitrogen oven to harden the photoresist 1 once, the temperature of the first hardening is 110 °C, N 2 The flow rate is 20L / min, and the baking time is 30min.

[0035] (2) Soak the die in the first corrosive solution for 4 minutes for Ni / Ag corrosion. The first corrosive solution contains HNO 3 with CH 3 COOH, aqueous solution at 18°C, HNO in the first corrosion solution 3 with CH 3 The total mass concentration of COOH is 80%, HNO 3 with CH 3 The mass ratio of COOH is 1:3. After corrosion, place the core in deionized water at a temperature of 18°C ​​to overflow for 2 minutes for cleaning. The cleaned core is dried in a semiconductor dryer. The speed is 1600rpm, the time...

Embodiment 2

[0040] The cross-sectional schematic diagram of the front metal layer of the high reverse voltage Schottky diode in each step of this embodiment is the same as that of Embodiment 1, so it will not be repeated here. The difference from Embodiment 1 lies in the process parameters in each step:

[0041] (1) if figure 1 As shown, a photoresist 1 with a thickness of 3 μm is coated on the surface of the front metal layer structure on the Schottky diode die substrate 5 that is sequentially evaporated and plated with Ti layer 4, Ni layer 3, and Ag layer 2 from bottom to top. Finally, place the tube core in a nitrogen oven to harden the photoresist 1 once, the temperature of the first hardening is 130°C, N 2 The flow rate is 22 L / min, and the baking time is 25 minutes.

[0042] (2) Soak the die in the first corrosive solution for 5 minutes for Ni / Ag corrosion. The first corrosive solution contains HNO 3 with CH 3 COOH, aqueous solution at 20°C, HNO in the first corrosion solution 3...

Embodiment 3

[0047] The cross-sectional schematic diagram of the front metal layer of the high reverse voltage Schottky diode in each step of this embodiment is the same as that of Embodiment 1, so it will not be repeated here. The difference from Embodiment 1 lies in the process parameters in each step:

[0048] (1) if figure 1 As shown, a photoresist 1 with a thickness of 4 μm is coated on the surface of the front metal layer structure on the Schottky diode die substrate 5 that is sequentially evaporated and plated with Ti layer 4, Ni layer 3, and Ag layer 2 from bottom to top. Finally, place the tube core in a nitrogen oven to harden the photoresist 1 once, the temperature of the first hardening is 150 ° C, N 2 The flow rate is 25L / min, and the baking time is 20min.

[0049] (2) Soak the die in the first corrosive solution for 8 minutes for Ni / Ag corrosion, the first corrosive solution contains HNO 3 with CH 3 COOH, aqueous solution at 22°C, HNO in the first corrosion solution 3 wit...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a wet etching method for a metal layer on the front surface of a high inverse-voltage Schottky diode, which solves the problems that the wet etching method in the prior art has many steps, is complex in operation and cannot effectively take over etching and residue of the metal layer Ti at the bottom layer into consideration, reverse leakage and early failure of the high inverse-voltage Schottky diode occur easily, and a large amount of metal ions are remained on the surface of a substrate of a diode core. The method comprises the following steps: hardening for the first time; performing Ni / Ag etching; washing; spin-drying; hardening for the second time; performing Ti etching; washing; performing ethylene diamine tetraacetic acid (EDTA) solution etching; washing; spin-drying; and removing photoresist. The method is simple in process steps and convenient for operation; the etching rate can be controlled well during etching; serious over etching and residue of the metal layer Ti at the bottom layer can be effectively taken into consideration; the metal ions remained on the surface of the substrate of the diode core can be removed at the same time; and influence of the metal ions on the electrical parameter characteristic of the high inverse-voltage Schottky diode is avoided.

Description

technical field [0001] The invention relates to the technical field of manufacturing Schottky diodes, in particular to a wet etching method for a front metal layer of a high reverse voltage Schottky diode. Background technique [0002] Schottky diodes are widely used in the fields of microwave frequency mixing, detection and high-speed switching circuits. The front of the substrate of the Schottky diode core currently used in the market is evaporated and plated with Ti layer, Ni layer, and Ag layer sequentially from bottom to top. Wherein the Ti layer is used as an adhesion layer, the Ni layer is used as a barrier layer, the Ag layer is used as an electrode layer, and the Ti layer, Ni layer and Ag layer constitute the front metal layer of the substrate. [0003] At present, in the manufacturing process of Schottky diodes, the traditional wet etching is to etch the Ag layer 2, Ni layer 3, and Ti layer 4 on the substrate 5 successively from top to bottom (see figure 1 ), afte...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/329H01L21/28
Inventor 王海峰
Owner HANGZHOU LION MICROELECTRONICS CO LTD