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Device for testing integrated circuit, has test sequence provider that provides different test bit sequences of test circuit based on error correction code indicated in coded binary word

A technology to be tested and a circuit, applied in the direction of measuring electricity, measuring electrical variables, digital circuit testing, etc., can solve problems such as triggering, unnecessary, error correction, etc.

Active Publication Date: 2013-03-06
INFINEON TECH AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Such errors can lead to error correction even if there are no erroneous codewords at the output of the correction circuit, which is disadvantageous
It is likewise disadvantageous if errors are incorrectly indicated due to faulty error detection circuits, which can unnecessarily trigger measures at the system level

Method used

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  • Device for testing integrated circuit, has test sequence provider that provides different test bit sequences of test circuit based on error correction code indicated in coded binary word
  • Device for testing integrated circuit, has test sequence provider that provides different test bit sequences of test circuit based on error correction code indicated in coded binary word
  • Device for testing integrated circuit, has test sequence provider that provides different test bit sequences of test circuit based on error correction code indicated in coded binary word

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Experimental program
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Embodiment Construction

[0022] The scheme described below relates generally to the processing of encoded data, which is encoded using code C. The following introduction is especially intended to illustrate how common concepts from coding theory are used here.

[0023] If C is, for example, a linear (n,k) code, that is, a linear code of length n with k information bits and n-k=m check bits, then the code C can pass through the (m,n) parity check matrix H and (k,n) generate matrix G to describe.

[0024] If the data bits or information bits to be encoded pass through description, then the codeword v= By the information bit u according to the relation

[0025]

[0026] constitute. pass

[0027]

[0028] Syndrome assigned to n-bit word , which is either a codeword of Code C or a non-codeword of Code C. here represents the transposed column vector of the row vector v' and s(v') T represents a row vector The transposed column vector of .

[0029] If its syndrome is equal to 0, that ...

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Abstract

The device (100) has a syndrome tester (110) that determines the mistake bit sequence based on coded binary word. A test sequence provider (120) provides different test bit sequences of the test circuit (102) based on the error correction code indicated in the coded binary word. An evaluation circuit (130) detects faulty processing of test bit sequence by the circuit to be tested based on the test bit sequence test output signal of the test circuit. Independent claims are included for the following: (1) method for testing circuit; and (2) computer program for testing circuit.

Description

technical field [0001] Embodiments according to the invention relate to the field of error correction and error identification in binary signals and in particular to devices and methods for testing circuits under test. Background technique [0002] Due to the further shrinking of the components of integrated circuits and the associated smaller voltage and current values, errors are increasingly occurring in integrated circuits and in particular also in circuits for error correction or for error detection. [0003] Such errors can lead to the disadvantage that an error correction is performed even if there are no erroneous codewords at all at the output of the correction circuit. It is likewise disadvantageous if an error is incorrectly indicated due to an incorrect error detection circuit, measures at the system level may be triggered unnecessarily. [0004] By adding redundancy, static or transient errors in the circuit can be identified in an electronic circuit. In this ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/317
CPCG01R31/318371G01R31/319G01R31/3183
Inventor U.巴克豪森M.格塞尔T.克恩T.拉贝纳尔特
Owner INFINEON TECH AG
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