Refractive index measurement method based on double-fiber point diffraction phase-shifting interference
A point diffraction phase shift and measurement method technology, applied in the field of optical precision measurement, can solve problems such as restricting development, and achieve the effect of reducing waste, efficient and rapid real-time monitoring
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[0025] The specific implementation manner of the present invention will be described in further detail below in conjunction with the accompanying drawings.
[0026] The basic principle of the present invention is based on the shearing interference of point light sources. Such as figure 1 As shown, the point light source P located at coordinates (0,0,R) 0 The spherical wave is diffracted, the exit pupil surface is located on the xoy plane, and the exit pupil center is located at the origin O of the xyz coordinate system. Assuming that the radius of curvature of the spherical wave is R, the equation of the spherical wave on the exit pupil surface is:
[0027] w ( x , y ) = z = R - R 2 - ( x 2 + ...
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