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Device and method for measuring infrared detector

A technology of infrared detectors and measuring devices, applied in the direction of electric radiation detectors, etc., can solve the problems of being unsuitable for large-sized cryogenic containers, low visible light transmittance, and difficulty in direct observation, so as to improve alignment accuracy and alignment efficiency, Improved measurement efficiency and high calibration accuracy

Active Publication Date: 2013-04-03
苏州市吴中中科育成科技发展有限公司
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  • Application Information

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Problems solved by technology

This method is not suitable for position adjustment of large-sized cryogenic containers such as refrigerators
In addition, the window material of cryogenic containers has low transmittance to visible light, making direct observation difficult
These all increase the difficulty of aligning the small-sized infrared detector with the measurement optical path in the cryogenic container

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  • Device and method for measuring infrared detector
  • Device and method for measuring infrared detector
  • Device and method for measuring infrared detector

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Embodiment Construction

[0034] The technical solutions in the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0035] figure 1 Shown is a schematic structural diagram of the measuring device of the infrared detector in the first embodiment of the present invention.

[0036] ginseng figure 1 As shown, the coordinate system (x, y, z) is defined, and the parallel infrared light B2 emitted by the infrared spectrometer 11 emerges along the -y direction. After the beam passes through the off-axis aspheric mirror 17, the light becomes B3, and the light B3 is focused in the x ...

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Abstract

The invention discloses a device and method for measuring an infrared detector. The device comprises an infrared spectrometer for providing monochromatic infrared light, a low-temperature device provided with an infrared window for receiving the infrared light, a detector to be measured, a reference detector, a movable platform driving the infrared spectrometer or the detector to be measured and the reference detector to move and a pre-amplifier connected with the detector to be measured and the reference detector respectively and used for amplifying a detecting signal and outputting the detecting signal to the infrared spectrometer, wherein the detector to be measured and the reference detector are arranged in the low-temperature device. First, alignment of the reference detector with a high responding degree in the low-temperature device is finished, and after the movable platform moves for a corresponding offset, automatic alignment of the detector to be measured is achieved. By means of the device and method, alignment efficiency and measuring precision of low-temperature measuring of the small-size low-responding-degree infrared detector can be improved, and multi-time repeated measurement for various samples is convenient.

Description

technical field [0001] The invention relates to a measuring device and a measuring method of an infrared detector. Background technique [0002] The spectral response of an infrared detector, that is, the change of responsivity with the wavelength of infrared radiation is an important indicator of the detector. The measurement of spectral responsivity needs to accurately estimate the optical power incident on the detector. Accurate photoelectric measurement requires that the working plane of the detector under test be perpendicular to the measuring light path of the spectrometer and placed at the focus of focused infrared light. In general spectrometers, the spot size of monochromatic light after focusing is hundreds of microns, and the size of infrared detectors is tens to hundreds of microns. alignment. [0003] Refrigerated infrared detectors need to be sealed in a cryogenic container. Small cryogenic containers such as metal Dewar bottles can be fixed and moved using a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10
Inventor 熊敏周桃飞邢利敏董旭张志强张宝顺
Owner 苏州市吴中中科育成科技发展有限公司