Label-free three-dimensional microscope method based on light filed propagation and device

A labeling, three-dimensional technology, applied in the field of optical super-resolution microscopy, can solve the problems of unsuitable biological samples, limited resolution, slow imaging speed, etc., to reduce the influence of environmental factors, improve the imaging rate, and reduce the CCD camera rate. the effect of the request

Inactive Publication Date: 2013-06-12
ZHEJIANG UNIV
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0005] The method of angle scanning is used to achieve three-dimensional reconstruction. Due to the need to achieve a wide range of angle traversal, the imaging speed is slow, and it is not suitable for the observation of biologically active samples.
Moreover, in the optical path of the existing tomographic phase microscope, the reference optical path and the sample optical path do not overlap, which will introduce certain environmental errors, which is not conducive to the continued improvement of resolution. At the same time, the current tomographic phase microscope is only limited to one-dimensional Scanning, which also has certain limitations on the improvement of resolution

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  • Label-free three-dimensional microscope method based on light filed propagation and device
  • Label-free three-dimensional microscope method based on light filed propagation and device
  • Label-free three-dimensional microscope method based on light filed propagation and device

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Embodiment Construction

[0036] Such as figure 1 As shown, a non-marking three-dimensional microscope device based on light field propagation, including a light source 1, a focusing lens 2, an aperture diaphragm 3, a collimating lens 4, a mirror 5, a two-dimensional scanning galvanometer 6, and a scanning lens 7 , Converging lens 8, sample stage 9, microscope objective lens 10, field lens 11, beam splitter 12, CCD-A13, CCD-B14, computer 15.

[0037] Wherein, the light source 1 emits the laser beam, the light source in the present embodiment is a helium-neon laser, focusing mirror 2, aperture diaphragm 3, collimating lens 4, reflecting mirror 5, two-dimensional scanning vibrating mirror 6, scanning lens 7, converging A lens 8, a sample stage 9, a microscope objective lens 10, a field lens 11, and a beam splitter 12 are sequentially arranged on the optical axis of the laser beam optical path.

[0038] CCD-A13 and CCD-B14 respectively correspond to the first CCD and the second CCD, and CCD-A13 and CCD-B...

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Abstract

The invention discloses a label-free three-dimensional microscope method based on light filed propagation. The method comprises the following steps of (1) focusing a laser beam and projecting the laser beam on a sample to be tested, and gathering the laser beam with sample information by utilizing a microobjective; (2) splitting the laser beam with the sample information into a first laser beam and a second laser beam, and acquiring light intensity information images of the first laser beam and the second laser beam through a first image sensor and a second image sensor; (3) changing an angle of the incident laser beam on the sample to be tested, scanning the sample to be tested, gathering the laser beam with the sample information by utilizing a microscope, and then repeating step (2); and (4) performing calculating analysis on the light intensity information image through a computer to obtain a corresponding phase delay distribution diagram, and then obtaining a three-dimensional image through a three-dimensional reconstruction algorithm. The invention further discloses a label-free three-dimensional microscope device based on light filed propagation.

Description

technical field [0001] The invention belongs to the field of optical super-resolution microscopy, in particular to a non-marking three-dimensional microscopy method and device based on light field propagation. Background technique [0002] With the development of science and technology, people are constantly pursuing smaller and smaller size structures and higher resolution capabilities, especially in the fields of microelectronics, aerospace, nanofabrication, life science and material engineering. demands are increasingly pressing. The development of transmission interferometric phase microscopy provides support for microscopic imaging under label-free conditions. [0003] Since the refractive index of the sample is different from that of the surrounding environment, the phase of the light will be modulated by the sample when the light is transmitted through the sample glass slide, thus carrying the refractive index and thickness information of the sample, and the sample r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 匡翠方修鹏刘旭葛剑虹
Owner ZHEJIANG UNIV
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