Analyzing device and analyzing method for trace impurities in organic pure substance
A trace impurity, analysis device technology, applied in the field of mass spectrometry
Inactive Publication Date: 2013-06-12
NAT INST OF METROLOGY CHINA
View PDF2 Cites 1 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
However, there are two commercial ion sources currently used for liquid chromatography-mass spectrometry: electrospray ionization sources and atmospheric pressure chemical ionization sources. Electrospray is suitable for ionization of polar molecules, and atmospheric pressure chemical ionization sources can be used for polar and weak molecules. ionization of polar molecules, and for the ionization of non-polar molecules, these two commercial ion sources are powerless
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0030] Such as figure 1 As shown, a trace impurity analysis device in organic pure substances includes: a liquid chromatograph 1, a cutting valve 2, a plasma-based ionization source and a mass spectrometer 7, and the plasma-based ionization source includes a nebulizer 3 and corona discharge needle 5;
[0031] A liquid chromatograph 1 is connected to a cutting valve 2 , an atomizer 3 , a corona discharge needle 5 and a mass spectrometer 7 in sequence.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more PUM
Login to view more
Abstract
The invention discloses an analyzing device and an analyzing method for trace impurities in an organic pure substance. The device comprises a liquid chromatograph, a cutting valve, an ionization source and a mass spectrometer, wherein the ionization source is based on plasma bodies and comprises an atomizer and a corona spray point. The liquid chromatograph is sequentially connected with the cutting valve, the atomizer, the corona spray point and the mass spectrometer. The method includes that a sample is sent into the liquid chromatograph and sequentially passes through the cutting valve and the ionization source based on the plasma bodies and the impurities in the sample are ionized and sent into the mass spectrometer. By utilization of the chemical ionization source based on the plasma bodies, not only can polarity impurity molecules and weak polarity impurity molecules be ionized, but also non-polar molecules can be ionized. Impurity ions of which main components are cut are sent into the mass spectrometer and then can be analyzed in terms of quality accordingly so that qualitative information of the impurity molecules is obtained.
Description
technical field [0001] The invention relates to the technical field of mass spectrometry, and more particularly, relates to a trace impurity analysis device and analysis method in organic pure substances. Background technique [0002] Chemometrics is the science of chemical measurement, the technical support of chemical measurement, and the technical basis for the unification of chemical measurement units and accurate and reliable values. The study of reference materials is one of the important research contents of stoichiometry, and pure reference materials are the basis for the research of solution and complex matrix reference materials, and the purity measurement of pure materials is the key to the development of pure reference materials. Developed countries such as the United States (NIST), Germany (BAM), the United Kingdom (LGC), Japan (NMIJ), Australia (NARL) and other countries generally realize that the measurement ability of pure products is an important basis for t...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more Application Information
Patent Timeline
Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N30/02
Inventor 李明方向熊行创江游黄泽建蔡九霄
Owner NAT INST OF METROLOGY CHINA
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Try Eureka
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap