A method for measuring the conversion efficiency of down-conversion luminescent thin films

Abstract

Provided is a measuring method of down-conversion luminescence film conversion efficiency. The measuring method of the down-conversion luminescence film conversion efficiency comprises the following steps: a, adopting a fluorescence spectrometer to obtain emitting photon numbers E(lambada) under different emission wavelengths in a fluorescence emission spectrum wavelength range; b, dividing incident light into reference light and second exciting light based on a dual light path detection mode of an accessory integrating sphere of an ultraviolet spectrophotometer, setting a proportionality coefficient k of reference light energy to second exciting light energy, and measuring and obtaining the reference light energy Eref; c, carrying out scaling on a transmittance of a band-pass filter, and obtaining a transmittance curve T(lambada) of the band-pass filter; d, adopting the integrating sphere to measure emitting light energy EEmi; and f, obtaining conversion efficiency of luminescence film under light illumination at a specific wavelength based on a computation formula of the conversion efficiency (CE).

Description

technical field [0001] The invention belongs to the technical field of scientific testing and relates to a method for measuring the conversion efficiency of a down-conversion luminescent film. Background technique [0002] Fluorescent luminescent technology usually utilizes the change of luminescent wavelength after the material is excited, such as LED photoluminescent materials and up-conversion materials of solar cells. In the silicon-based ultraviolet detection technology, the luminescent film can convert high-energy photons into a large number of low-energy photons, so the detector response can be broadened to the ultraviolet band. Conversion efficiency CE (Conversion Efficiency) is an important parameter to measure the above-mentioned conversion luminescence process. [0003] There are two traditional test methods for conversion efficiency. One is to calculate the conversion efficiency by measuring the quantum efficiency, which is calculated by the number of electrons ...

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Problems solved by technology

[0003] There are two traditional test methods for conversion efficiency. One is to calculate the conversion efficiency by measuring the quantum efficiency, which is calculated by the number of electrons that can be generated and collected for each incident photon. Although no parameters are required, the Due to the need to take into account the reflection loss of photons that cannot be transmitted to the silicon wafer, photoelectric conversion, changes in the transmission efficiency of electrons and photons, and the efficiency of conversion current, etc., the calculation process is complicated and will bring large calculation errors.

The other is to use the optical power meter to directly receive the fluorescent photons. Although the photoelectric conversion is omitted and the shortcomings of the first method are overcome, in order to overcome the shortcomings of the small detection area of ​​the optical power meter and the incomplete collection of fluorescent light, When calculating the total emission energy, a correction factor is introduced to correct the problem of incomplete fluorescence collection. The fluorescence emitted by the down-conversion luminescent film is approximately considered as an isotropic spherical wave, and the influence of the emission angle of the fluorescence is ignored. The fluorescence is not isotropic, so introducing a correction factor to calculate the total emitted light energy will also bring some errors to the test results

The above measurement methods cannot well meet the measurement requirements for the conversion efficiency of fluorescent luminescent thin films

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