SRAM (Static Random Access Memory) single event latch-up effect testing system and method

Abstract

The invention relates to an SRAM (Static Random Access Memory) single even latch-up effect testing system and method. The SRAM single event latch-up effect testing system comprises a host computer, a secondary controller, an SEU (Single Event Upset) testing circuit, a current testing circuit, a latch-up protection circuit and a power supply module. The SRAM single-particle latch-up effect testing system and method have the advantages of being capable of acquiring a single event upset cross section and a latch-up cross section simultaneously, shortening an experimental period, saving experiment costs, and enabling the measurement to be more accurate and efficient.

Description

technical field [0001] The invention relates to an asynchronous random access memory (SRAM) device testing system and method, in particular to a SRAM device single-event latch-up effect testing system and method. Background technique [0002] In space satellite control systems, SRAM devices have been widely used as important data storage media, but protons and heavy particles in space will cause SRAM devices to produce single-event flipping and single-event locking effects, which makes the control system disorder and becomes an impact. The main factor of spacecraft life and reliability. Therefore, carrying out the ground simulation of the single event effect of satellite SRAM devices and obtaining the single event flipping cross section and blocking cross section of SRAM devices has become the main work to evaluate the single event resistance ability of SRAM devices. [0003] SEL (Single Event Latch, SEL) is a low-impedance, high-current phenomenon that occurs in PNPN semic...

AI Technical Summary

Problems solved by technology

However, for SRAM devices, the power-off will cause the internal filling data to be lost, making it impossible to accurately obtain the single-event flipping cross-section while obtaining the single-event blocking cross-section

If two parameters can be obtained accurately, repeated experiments must be repeated many times, which makes the experiment cycle long and difficult to adapt to the current situation of domestic single event effect experimental equipment and machine time constraints.

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