Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Gas diffusion homogenization device and plasma process equipment using same

A technology of gas diffusion and plasma, applied in ion implantation plating, gaseous chemical plating, metal material coating process, etc., can solve the difficulty and cost of machining and assembly of vacuum chamber, cost increase, difficulty and High cost and other issues, to achieve the effect of improved gas diffusion uniformity, cost reduction, simple and reliable machining and installation

Inactive Publication Date: 2013-07-03
北京普纳森电子科技有限公司
View PDF3 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

First, it increases the difficulty and cost of machining and assembly of the vacuum chamber
Secondly, if a single vacuum pump is used, how to connect the four vacuum ports on the chamber with the single air inlet on the vacuum pump becomes another difficult and costly technical problem, because these four connecting pipes must Together, and the geometric position needs to be symmetrical; if multiple vacuum pumps are used, the cost will increase significantly, and the pumping speed of each vacuum pump needs to match

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Gas diffusion homogenization device and plasma process equipment using same
  • Gas diffusion homogenization device and plasma process equipment using same
  • Gas diffusion homogenization device and plasma process equipment using same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] Such as image 3 As shown, an embodiment of the gas diffusion homogenization device provided by the present invention includes three diffusion rings, from top to bottom: the first diffusion ring 3a, the middle diffusion ring 3b and the bottom diffusion ring 3c, and the three diffusion rings From the appearance, it is three ring plates. Several gas through-holes are evenly arranged on the three diffusion rings, that is, the center distances of adjacent gas through-holes are equal, and the gas through-holes on the same diffusion ring are of equal size. The number and size of the gas passage holes on the diffusion rings of each layer are different. The gas through holes on the two adjacent layers of diffusion rings are staggered and symmetrically arranged, that is, the central axes of the gas through holes on the two layers of diffusion rings do not coincide with each other, and one gas through hole on a certain layer of diffusion rings There is an equal minimum distance...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a device for improving the diffusion homogeneity of gas in a vacuum chamber. The device comprises one or more stacked diffusion parts with a plurality of gas through holes, wherein the diffusion parts are matched with the corresponding cross sections of the spaces of the vacuum chamber in shape and size, so that the vacuum chamber is divided into two spaces by the diffusion parts, and a gas lead-in hole and a vacuum orifice are formed in the two spaces respectively. The invention further provides plasma process equipment provided with the gas diffusion homogenization device; the gas diffusion homogenization device is mounted in a space between the inner wall in the vacuum chamber and the lower bottom surface of a lower electrode; a gas lead-in device and the vacuum orifice are formed in the two spaces respectively; and the upper end surface of the lower electrode and the gas lead-in device are positioned in the same space. The diffusion homogeneity of the gas in the vacuum chamber is effectively improved in a simple way of configuring the diffusion parts, so that the plasma process homogeneity is remarkably improved. Compared with the conventional technical solution, the mechanisms involved in the invention are easy to realize, the machining and mounting operations are simple and reliable, and the cost is also remarkably reduced.

Description

technical field [0001] The invention relates to a gas diffusion uniform device, in particular to a device for improving the gas diffusion uniformity in a vacuum chamber. The invention also provides plasma processing equipment provided with the gas diffusion homogenization device. Background technique [0002] Many manufacturing processes of semiconductor integrated circuit chips, LED chips and other microelectronic chips use the process steps of film growth or etching in a vacuum environment. The thin film growth process is to grow new thin film materials on the surface of the substrate. The commonly seen types of processes include plasma enhanced chemical vapor deposition (PECVD), metal organic chemical vapor deposition (MOCVD) and physical vapor deposition (PVD), etc. . The etching process is to selectively form volatile reactants from the surface of the substrate to remove materials. The commonly seen process types are inductively coupled plasma (ICP) etching process an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/455C23C16/50C23C14/22C23C14/48C23F4/00
Inventor 赖守亮季安
Owner 北京普纳森电子科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products