Field programmable gate array (FPGA) device for diagnosing and predicting artificial circuit faults

A technology for simulating circuit faults and simulating circuits, which is applied in the direction of analog circuit testing, electronic circuit testing, etc., can solve the problems of lack of verification platform for analog circuit fault diagnosis and prediction algorithms, data processing lag, and staying in the simulation stage, etc., to achieve simulation Circuit fault diagnosis and prediction Real-time and remote monitoring, the effect of high circuit integration

Active Publication Date: 2013-07-10
HUNAN UNIV
View PDF6 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to solve the problem that the analog circuit fault diagnosis and prediction algorithm lacks a verification platform and stay in the simulation stage, overcome the disadvantages of the traditional verification platform with a computer as the core, which has a huge hardware system and lagging data processing, and provides A highly integrated FPGA device with rich analog circuit fault characteristic signal acquisition interface and powerful fault characteristic information calculation capability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Field programmable gate array (FPGA) device for diagnosing and predicting artificial circuit faults
  • Field programmable gate array (FPGA) device for diagnosing and predicting artificial circuit faults
  • Field programmable gate array (FPGA) device for diagnosing and predicting artificial circuit faults

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] The present invention will be further described below in conjunction with drawings and embodiments.

[0051] refer to figure 1 , the FPGA device used for analog circuit fault diagnosis and prediction of the present invention includes an FPGA board U1, the FPGA board U1 is connected to the computer host U3 by means of Ethernet communication, and the host computer software U2 runs in the computer host U3.

[0052] The FPGA board U1 is used to complete the collection, buffering, preprocessing, and backup of the accessible node voltage information and network spectrum characteristic data of the analog circuit to be tested, and package and transmit the original signal and analog circuit fault information to the host computer software U2;

[0053] Described upper computer software comprises ethernet driver program and interface software;

[0054] The host computer software U2 is used to receive the data frame sent by the FPGA board, provide interface software for analog circ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A field programmable gate array (FPGA) device for diagnosing and predicting artificial circuit faults comprises an FPGA board card, wherein the FPGA board card is connected with a computer host machine in Ethernet communication mode, and upper machine software is operated in the computer host machine. The FPGA board card is used for acquisition, cache, preprocessing and back-up of accessible node voltage information and network spectrum characteristic data of an artificial circuit to be tested and packing and transmitting an original signal and artificial circuit fault information to the upper machine software. The upper machine software is used for receiving data frames sent by the FPGA board card, provides interface software for diagnosing and predicting the artificial circuit faults, simultaneously provides a delivery interface of original data and can seamlessly deliver the data to other analysis platforms of the computer host machine to perform follow-up processing, analysis and back-up. The FPGA device for diagnosing and predicting the artificial circuit faults tests and diagnoses some large-scale naval ship artificial circuits and a radio frequency identification device (RFID) filter network, the accuracy rate of fault diagnosis is larger than 95%, and the false rejection rate and the false accept rate are smaller than 3%.

Description

technical field [0001] The invention relates to the field of analog circuit fault detection, diagnosis and prediction, and more specifically relates to an FPGA device for analog circuit fault diagnosis and prediction. Background technique [0002] In analog circuits, factors such as device nonlinearity, tolerance, and environmental changes often cause various faults in the circuit, especially the soft faults do not have obvious regularity and reproducibility. In the research and development of analog circuit fault diagnosis for more than 60 years, many methods have emerged, such as: fault dictionary method, parameter identification method, fault verification method, fuzzy theory, neural network and wavelet analysis, etc., which provide a solution for analog circuit faults. Some phased ideas and plans. However, most of the above methods stay in the simulation stage. The real-time signal processing system with FPGA as the core has been widely used in communication, radar, im...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/316
Inventor 何怡刚罗旗舞于文新吴先明郑剑李中群
Owner HUNAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products