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Extruding and drawing device for in-situ structure detection in combination with scattering of X rays and experimental method thereof

A technique for tensile devices, structural inspection, applied in measurement devices, material analysis using radiation diffraction, material analysis using wave/particle radiation, etc., can solve problems such as disconnection

Active Publication Date: 2013-07-24
UNIV OF SCI & TECH OF CHINA +4
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Most of the basic physical model research is limited to low shear rate and some ideal conditions, which are out of touch with the actual forming process, and cannot directly guide the forming process under high shear and actual engineering conditions

Method used

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  • Extruding and drawing device for in-situ structure detection in combination with scattering of X rays and experimental method thereof
  • Extruding and drawing device for in-situ structure detection in combination with scattering of X rays and experimental method thereof
  • Extruding and drawing device for in-situ structure detection in combination with scattering of X rays and experimental method thereof

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Embodiment Construction

[0041]Below in conjunction with accompanying drawing and embodiment further illustrate the present invention.

[0042] A kind of extruding stretching device combined with X-ray scattering, see appendix figure 1 , the high-precision extrusion control module 1 drives the screw to rotate, and extrudes the sample out of the die. The sample enters the No. 1 cavity 3 and is pulled or stretched by the No. 1 roller set 5 . Then the sample enters the No. 2 cavity 4 and is pulled or stretched by the No. 2 roller set 6 . The distance between the No. 1 and No. 2 roller sets can be adjusted by the screw mechanism 7 to ensure that the deformation rate and deformation amount of the sample between the two roller sets can be adjusted. The first cavity and the second cavity are controlled independently to meet the needs of simulating different processing temperature fields. The surface of the rollers of the No. 1 roller group and the No. 2 roller group is sprayed with polytetrafluoroethylene...

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Abstract

The invention provides an extruding and drawing device for in-situ structure detection in combination with the scattering of X rays and an experimental method thereof. The device comprises two parts, namely a vertical extruding machine and a drawing device. The rotation of a screw of the vertical extruding machine and the lifting of a machine head of the vertical extruding machine are both controlled by a high-precision servo motor. The drawing device adopts a double-chamber structure, and a group of roller wheels driven by the high-precision servo motor are arranged in each chamber to realize the drawing or the traction of extruded samples. All the motor movement is under integrated control of Labview software. The distance of the two groups of roller wheels of the drawing device is continuously adjustable by a lead screw, so that the requirements of different drawing modes and different drawing speeds can be met. The temperature control of the two chambers of the drawing device is independent to meet the requirements of simulating of complex temperature fields. The device disclosed by the invention can be used for performing the in-suit study on the structural evolutionary process of macromolecules under real extruding and drawing processing conditions in combination with the scattering of the X rays. The device is a good device for studying the relationship of structure evolution action and the processing conditions in the extruding and drawing process of a high molecular material.

Description

technical field [0001] The present invention relates to the technique of using X-ray scattering to study the relationship between structural evolution and external field parameters in the extrusion stretching process of polymer materials, and in particular to an extrusion stretching device and its experimental method for in-situ structure detection combined with X-ray scattering , which can study the structural evolution behavior of different polymer materials under different temperature fields and different stretching fields. By coupling the structural information of polymer materials obtained by X-ray scattering (such as crystallinity, lamella thickness, degree of orientation) with processing external field parameters, the relationship between processing external field parameters and the structural properties of polymer materials can be obtained. It is used in the laboratory to simulate the actual stretching processing conditions of polymer materials, and to reveal scientifi...

Claims

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Application Information

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IPC IPC(8): G01N23/20G01N23/201
Inventor 李良彬崔昆朋刘艳萍孟令蒲李静
Owner UNIV OF SCI & TECH OF CHINA
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