A method, device and system for testing performance of electronic equipment

Abstract

The embodiment of the invention discloses a method and equipment for testing performances of electronic equipment. The method comprises the steps as follows: obtaining audio and video signals of the electronic equipment; converting the audio and video signal format to a predefined data format, and obtaining a test signal corresponding to the predefined data format; and obtaining the type of the test signal if the test signal is identified to be abnormal, and controlling, collecting and storing parameters of the electronic equipment corresponding to the type of the test signal, so that automatic test on roasting performance of the electronic equipment is realized, monitoring time of test personnel is saved, and collection equipment for collecting parameters of the electronic equipment corresponding to the type of the test signal can be controlled automatically; all required parameters when failure occurs are recorded, so that test personnel can view the parameters of the electronic equipment freely and conveniently; and an auxiliary tool for analyzing failure of the electronic equipment is provided, so that efficiency and accuracy for machine roasting test are further improved.

Description

technical field [0001] The invention relates to the field of electronic technology, in particular to a method, device and system for testing the performance of electronic equipment. Background technique [0002] When existing electronic equipment equipped with audio and video processing devices (such as a set-top box) is in the development stage, designers will conduct reliability tests on the electronic equipment to test the reliability of the electronic equipment. A key link in the reliability test of electronic equipment is the oven test, which refers to the copy machine test after the functional test of the electronic equipment is completed. The oven test is generally divided into low temperature oven test, normal temperature oven test and high temperature oven test. Test, that is, after the functional test is passed, it has been confirmed that the electronic device has no functional problems, then the electronic device is turned on, and then the electronic device is pla...

AI Technical Summary

Problems solved by technology

Because in the development stage of electronic equipment, designers need to test under what conditions the electronic equipment will be unstable. However, the instability of electronic equipment cannot be reproduced at the initial stage of design, and the instability is random. If it occurs, the designer does not know under what conditions the instability will occur. Therefore, within the time limit specified for the roasting machine test, the designer needs to spend a lot of energy to monitor the copying test equipment in real time in order to accurately locate the problem.

If the designer ignores the occurrence of unstable conditions during the copy test with a long specified time limit, it will take more time for the designer to perform the copy test again

However, repeating the copying test on the same electronic device will damage the performance of the electronic device. Even the test results obtained by the copying test in the same environment at the same time are random, and the test results obtained by repeated copying tests cannot be determined. The error is within the allowable range, so it not only consumes time and cost, but also cannot accurately locate the problem of unstable electronic equipment, which reduces the efficiency of copying test

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