High-power high-voltage silicon stack full dynamic aging tester

Abstract

The invention discloses a fully dynamic aging tester for a high-power and high-voltage silicon stack in the electronic component production field. The tester comprises a rectification conversion circuit, a test power source control circuit, a high-power forward current source generation circuit, a high-power backward voltage source generation circuit, a sampling circuit and a display and alarm circuit, and is characterized in that the test power source control circuit comprises a test current source control circuit, a test voltage control circuit, a current / voltage switch control circuit and a test total time length timer circuit, a test sample is placed in a heating oil tank, the high-power current and voltage sources are switched automatically in positive and negative half cycles, working currents are applied to an alternating current positive half cycle, backward working voltage is applied to a negative half cycle, and the rectification conversion circuit heats medium insulating oil and keeps the medium insulating oil at a constant temperature. Compared with the prior art, the fully dynamic aging tester for the high-power and high-voltage silicon stack has the advantages that the work is reliable, the efficiency is high, the operation is safe, and the like.

Description

technical field [0001] The invention relates to a test instrument in the field of electronic component production, in particular, the invention is a high-power high-voltage silicon stack full-dynamic aging tester. Background technique [0002] With the advancement of science and technology, electronic products are more and more widely used in people's lives. Different electronic products have different requirements for electronic components due to their different working environments and functions. In the field of electronic component production, for production In order to produce qualified products, it is necessary to carry out full-dynamic testing on the products produced to achieve the expected product reliability data. During the use of electronic products, due to voltage fluctuations and load changes, electronic products will be overloaded, which requires electronic components to have a certain overload capacity. In order to test the performance of the electronic compon...

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Problems solved by technology

During the use of electronic products, due to voltage fluctuations and load changes, electronic products will be overloaded, which requires electronic components to have a certain overload capacity. In order to test the performance of the electronic components produced, their overload capacity is tested. With the upgrading of products, the current high-power high-voltage silicon stack full dynamic aging tester cannot meet the testing requirements of high-current high-voltage silicon stack (high-voltage diode)

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