Method for measuring orientation differences of orientation silicon steel crystal particles

A grain-oriented, oriented silicon steel technology, applied in measuring devices, material analysis using wave/particle radiation, instruments, etc., can solve problems such as increased measurement deviation, sample deviation from rolling direction, and selected area is not large enough to achieve The effect of avoiding errors, simple operation and convenient measurement

Inactive Publication Date: 2013-09-04
ZHONG NAT ENG & RES CENT
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this measurement method has the problem that the sample deviates from the rolling direction during the process of cutting the silicon steel sheet into small pieces and stacking the small pieces, and the selected area is not large enough, resulting in increased measurement deviation

Method used

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  • Method for measuring orientation differences of orientation silicon steel crystal particles
  • Method for measuring orientation differences of orientation silicon steel crystal particles
  • Method for measuring orientation differences of orientation silicon steel crystal particles

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0033] Choose high magnetic induction oriented silicon steel sheets with different magnetic induction intensities, the size is 300mm×30mm×0.3mm, the magnetic induction B 8 They are 1.914T, 1.892T, 1.845T, 1.773T respectively, and the numbers are 1#, 2#, 3#, 4#.

[0034] The scanning electron microscope used in this experiment is a Zeiss ZEISS SUPRA55VP scanning electron microscope equipped with an EDAX OIM electron backscatter diffraction (EBSD) system.

[0035]According to the method of the present invention, at first take the small piece sample of 100mm * 10mm * 0.3mm in the central part of every silicon steel sheet, successively use 200# sandpaper, 600# sandpaper, 800# sandpaper, 1000# sandpaper, 1200#, 1500# Grinding with sandpaper, and then electropolishing to be suitable for EBSD detection. Scan each grain in the selected area of ​​the test sample to obtain the Euler angle of each grain, calculate the orientation difference between adjacent grains and between grains and...

Embodiment 2

[0040] Select ordinary oriented silicon steel sheets with different magnetic induction intensities, the size is 300mm×30mm×0.27mm, the magnetic induction B 8 They are 1.905T, 1.883T, 1.877T, 1.792T respectively, and the numbers are 5#, 6#, 7#, 8#.

[0041] The test sample preparation and detection method are the same as in Example 1, and the finally obtained data are shown in Table 2.

[0042] It can be seen from Table 2 that for the ordinary grain-oriented silicon steel sheet in this embodiment, as the magnetic induction intensity B 8 The decrease of the average misorientation Ψ increases.

[0043] Table 2 Test results of misorientation between grains, misorientation between grains and standard Gaussian texture, and average misorientation

[0044]

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Abstract

The invention belongs to the technical field of crystal structure measurement through measuring back scattering, and relates to a method for measuring the orientation differences of orientation silicon steel crystal particles by utilizing an EBSD (Electron Back-Scattered Diffraction) technique. The method provided by the invention comprises the following steps of: measuring the euler angle of each crystal particle in a taken test sample by adopting the principle of detecting the crystal particle orientation by adopting the EBSD, and calculating the orientation differences of adjacent crystal particles and the orientation differences between the crystal particles and a standard goss texture, thereby obtaining the corresponding relationships between the magnetic induction intensity and the orientation differences. The method has the advantages of, rapid measurement speed, large measurement region, intuitive and understandable expression, typical obtained result and the like, and is simple to operate.

Description

technical field [0001] The invention belongs to the technical field of measuring crystal structure by measuring backscattering, and relates to a method for detecting misorientation of oriented silicon steel crystal grains by using electron backscattering diffraction (EBSD) technology. Background technique [0002] Cold-rolled grain-oriented silicon steel sheet is a 3% Si-Fe soft magnetic material with {110}〈001〉texture (Goss texture), its production process and equipment are complicated, and its manufacturing technology is strict. Art Products". The magnetic induction of grain-oriented silicon steel is B 8 Indicates that the B of high magnetic induction grain-oriented silicon steel 8 Generally around 1.92T, while the B of ordinary grain-oriented silicon steel 8 The value is generally around 1.82T. In order to achieve the best magnetic properties, the grain size of high magnetic induction oriented silicon steel and some ordinary oriented silicon steel products is above 10...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203
Inventor 仇圣桃樊立峰项利张晨凌晨付兵干勇李军
Owner ZHONG NAT ENG & RES CENT
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