Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument

A scanning electron microscope, sample stage technology, used in instruments, scanning probe technology, etc.

Inactive Publication Date: 2015-06-10
LANZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, no research group or company has proposed or developed similar frontier magnetic transport scientific research equipment at home and abroad.

Method used

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  • Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument
  • Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument
  • Scanning electron microscope magnetic resistance measurement sample stage and nano single magnetic transport property measuring instrument

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Embodiment Construction

[0021] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0022] Such as figure 1 As shown, the inventors used NiFe / Pt multilayer nanowires as samples, and measured magnetic transport property data in situ and at room temperature on a scanning electron microscope with a magnetic transport measuring instrument.

[0023] Such as figure 2 As shown, the scanning electron microscope magnetoresistance measurement sample stage includes a base 4, a rotating body 7, a card stage 8, a rotating shaft 3, and a sample stage 6. The outside of the base 4 is cylindrical, and the inner wall of the base 4 is provided with threaded grooves. The stack is located inside the base 4, the rotating body 7 is located on the base 4, the rotating body 7 is connected to the base 4 through the rotating shaft 3, the nut-shaped card table 8 is connected to the rotating shaft 3 and the rotating body 7, and the sample table 6 is located on t...

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Abstract

The invention belongs to measuring methods for magnetic nano materials and magnetic-nanostructure device transport properties, particularly relates to a scanning electron microscope magnetic resistance measurement sample stage and a nano single magnetic transport property measuring instrument. The scanning electron microscope magnetic resistance measurement sample stage comprises a base, a rotator, a nut-shaped clamping stage, a rotating shaft and a sample stage, the base is provided a cylindrical outside, screwed grooves are formed on the inner walls of the base, a piezoelectric pile is arranged inside the base, the rotator is arranged on the base and connected with the same through the rotating shaft, the clamping stage is connected with the rotating shaft and the rotator, and the sample stage is arranged above the clamping stage. The biggest innovation of the scanning electron microscope magnetic resistance measurement sample stage is that, for the first time throughout the world, a magnetic field is introduced into a scanning electron microscope, so that real-time, dynamic and visualized magnetic transport property in nano spaces can be measured, and fixed, rapid, visual and whole-process monitoring and petrophysical property measuring can be realized.

Description

technical field [0001] The invention belongs to a method for measuring the transport properties of magnetic nano materials and magnetic nano structure devices, in particular to a scanning electron microscope magnetoresistance measurement sample stage and a nano single magnetic transport property measuring instrument. Background technique [0002] At the end of the last century, it was expected that nanotechnology would be put into practical application on a large scale within one or two decades. However, ten years later, this wish has not been realized as expected. One fundamental reason is that the research on nanotechnology lacks sufficient and effective , Equipment, tools and detection systems that can precisely manipulate, tailor and assemble individual nanomaterials and measure the precise physical properties of nanometer monomers at the nanoscale spatial scale. For the research of magnetic nanomaterials and magnetic nanostructure devices, especially the measurement of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q30/02
Inventor 彭勇张军伟金斌玲谢凤珍马鸿斌兰倩倩薛德胜
Owner LANZHOU UNIVERSITY
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