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Pseudorandom low-power dissipation test method based on distances between test codes

A test method and test code technology, which is applied in digital circuit test, electronic circuit test, etc., can solve the problems of increased test code power consumption, reduced test fault coverage, reduced test efficiency, etc., to achieve the effect of reduced test power consumption

Inactive Publication Date: 2013-10-09
SHANGHAI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] (1) The randomly generated test code is likely to have the same code many times, which becomes an invalid code and reduces the test efficiency;
[0005] (2) Multiple randomly generated test codes may test exactly the same fault or a similar set of faults, which reduces the fault coverage of the test
[0021] However, enlarging the distance between the test codes will inevitably increase the power consumption of the input test codes, so it is necessary to orderly adjust the input sequence of the test codes to achieve the goal of minimizing power consumption

Method used

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  • Pseudorandom low-power dissipation test method based on distances between test codes
  • Pseudorandom low-power dissipation test method based on distances between test codes
  • Pseudorandom low-power dissipation test method based on distances between test codes

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Experimental program
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Effect test

Embodiment 1

[0065] see Figure 4 , the pseudo-random low-power test method based on the distance between test codes, including the following steps, is characterized by:

[0066] Step 1: Randomly select an input vector from the input combination of the function F as the first test code, denoted as t 0 .

[0067] Step 2: Test Code t 0 Bitwise inversion (denoted as ),Pick t 1 = as the 2nd test code.

[0068] Step 3: Select the second from the generator matrix corresponding to the function F i test code t 2i ( i =1,..., k , k is the number of test patterns that need to be generated by default), so as to maintain the TCD between the previously generated test patterns ( t 2i ) is equal to a preset value. and negate it, as the 2nd i + 1 test code t 2i+ 1 , and finally add these two test codes to the test set M together.

[0069] Step 4: Repeat Step 3. Until all required test patterns are selected.

[0070] Step 5: Sort the test codes in the test set M.

[0071]

Embodiment 2

[0073] This embodiment is basically the same as Embodiment 1, and the special features are as follows:

[0074] The step 3 in the first embodiment includes: introducing a generation matrix method to preset the distance between test codes for generating pseudo-random test codes.

[0075] Step 5 described in Embodiment 1 includes:

[0076] Step 5.1: Let the original test code set be M, and let it exist in M k already generated test codes, any test code is taken as the first test code in the new test sequence, denoted as t 0 , stored in the first address M of M 0 ;

[0077] Step 5.2: Assume that the set M has been selected i test code t 0 ~t i-1 , and has been stored in M 0 ~M i-1 middle. Implement an improved greedy algorithm to select the next target test code t i , making d (t i-1, t i ) is the minimum number of jumps, and the selected test code is recorded as t i (If there is the same minimum number of jumps, select the one with the smallest sequence number in...

Embodiment 3

[0083] In this example:

[0084] The Boolean expression: F( x 1 , x 2 , …, x 11 ) for an input variable n = 11 Boolean function, using the linear encoding method, to construct a (11, 6) generating matrix

[0085]

[0086] In this embodiment, the pseudo-random low power consumption test method based on the distance between test codes is based on Microsoft visual studio 2010, and implemented with C# as the programming language.

[0087] According to the above generated matrix, 63 test codes (excluding zero vectors) can be obtained, and the distance between the generated test codes must be ??4. This embodiment selects k = 12 test codes as an example to verify:

[0088] Such as Figure 4 As shown, this pseudo-random low-power test method based on the distance between test codes includes the following steps, and its characteristics are:

[0089] Step 1: Randomly select an input vector (11100100000) from the input combination of function F as the first test code, den...

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Abstract

The invention relates to a hypothetical pseudorandom low-power dissipation test method based on distances. The test method comprises the following steps of firstly, randomly selecting an input vector in an input combination of a function F, using the input vector as a first test code, marking the first test code as t0, secondly, conducting bitwise negation (marking the bitwise negation as ) on the test code t0, taking t1= , using t1 as a second test code, thirdly, selecting a 2ith test code t2i (i=1,...,k, k is the preset number of the test codes required to be generated) from a generated matrix corresponding to the function F so as to keep the TCD (t2i) between the 2ith test code t2i and the pre-generated test codes to be equal to a preset value, conducting negation on the TCD (t2i), using the negation of the TCD (t2i) as a 2i+1st test code t2i+1, finally, jointly adding the two test codes into a test set M, fourthly, repeating the third step until the selection of all the required test codes is finished, and fifthly, sorting the test codes in the test set M. Compared with a traditional random test, the pseudorandom low-power dissipation test method can achieve the same fault-coverage rate by using fewer test codes, and test power dissipation is greatly reduced by sorting the test codes.

Description

technical field [0001] The invention relates to the field of computer software and hardware fault testing, in particular to the field of fixed fault diagnosis algorithms based on random testing, and proposes a pseudo-random low-power consumption testing method based on the distance between test codes. Background technique [0002] Basic knowledge introduction: [0003] With the increase of VLSI integration and process complexity, the method of generating test codes through deterministic testing is no longer suitable for industrial testing due to the large time cost. In order to use less hardware to achieve higher fault coverage, the tester proposed a random testing method. However, due to the following two problems in the random test, the efficiency of this method is greatly reduced compared with the deterministic test under the same conditions [0004] (1) The randomly generated test code is likely to have the same code many times, which becomes an invalid code and reduce...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/317
Inventor 吴悦顾苏贇张鼎徐拾义
Owner SHANGHAI UNIV
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