A Method of Microcontact Characteristics and Image Thresholding Based on Morphological Features

A topographic feature and micro-contact technology, applied in the field of image processing, can solve the problem of difficult to reasonably characterize the contact area, and achieve the effects of reliable processing results, accurate contact characteristics, and wide application range.

Inactive Publication Date: 2016-04-27
BEIHANG UNIV
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Problems solved by technology

[0004] The technical problem of the present invention is to overcome the deficiencies of the prior art, provide a micro-contact characteristic and image threshold processing method based on topographical features, and solve the problem that the contact area of ​​the irregular surface is difficult to be reasonably represented in the contact analysis of the theoretical model , by thresholding and binarizing the contour image of the surface, a method for accurately calculating the contact area of ​​the microcontact model is obtained

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  • A Method of Microcontact Characteristics and Image Thresholding Based on Morphological Features
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  • A Method of Microcontact Characteristics and Image Thresholding Based on Morphological Features

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[0027] The implementation of the method of the present invention will be described in detail below in conjunction with the accompanying drawings. The flow chart of the method is as figure 1 shown.

[0028] Inventing this surface representation and image threshold analysis method applied to micro-contact features is characterized by its unique surface representation method and threshold processing technology. The specific implementation of the method is as follows:

[0029] Step 1: First, wipe the surface to be analyzed with 95% alcohol to remove oil stains on the surface, so as not to affect the accuracy of modeling. Determine the surface contact area that needs to be modeled, place it under the laser microscope, and use the laser microscope to image the surface of the sample to be studied. The sampling benchmark is based on the plane where the ideal surface is located. The computer acquisition system acquires the Image of the topographic features of the sample surface.

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Abstract

The invention provides a micro-contact characteristic and image threshold value processing method based on feature characteristics. The micro-contact characteristic and image threshold value processing method comprises the following steps: carrying out surface imaging on the surface of a sample needing to be researched to obtain micro-feature characteristics of the surface of the sample; setting a sampling dot matrix density and outputting dot matrix data for describing a surface outline characteristic; after removing error points and carrying out interpolation treatment, carrying out reading-in treatment to lead a fitted curved surface in to carry out contact analysis; sealing the curved surface into an entity through MODEL operation to establish a sealed entity; carrying out mesh generation on the led entity and carrying out a plurality of times of thinning of a surface mesh to obtain a finite element model for analysis; and carrying out pre-stress contact analysis to obtain a pre-stress distribution image of a contact surface to obtain conditions of pre-stress with different threshold value ranges. A researcher calculates areas occupied by outlines under different colors so as to accurately obtain a contact area between the contact surfaces under a contact state. According to the micro-contact characteristic and image threshold value processing method disclosed by the invention, the contact characteristics of the contact surfaces can be effectively and accurately obtained.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to a method for processing micro-contact characteristics and image thresholds based on topographic features. Background technique [0002] Regarding the characterization of rough surface morphology, with the continuous development of measuring instruments, the research on digital simulation technology is also deepening. In the 1980s, STM and AFM invented by G. Binnig and H. This kind of SPM technology has brought 3D microscopic shape measurement and analysis into a new stage. [0003] The method of using the traditional microcontact method to study the friction characteristics of materials began in the 1960s. The classic statistical analysis microcontact mechanical model was jointly proposed by Greenwood and Williamson in 1966. In 1970, Whitehouse and Archard jointly established the same based on statistical parameters. W-A model. In 1988, WR.Chang established a coefficient...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T17/30
Inventor 王延忠魏彬宁克焱韩明郭超吴向宇李圆
Owner BEIHANG UNIV
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