Test power source for large-power microwave device

A microwave device and test power supply technology, which is applied in the direction of measuring electricity, measuring electrical variables, instruments, etc., can solve the problems of low working efficiency, fast protection and reliable operation of high-power microwave device test power supply, and achieve volume reduction and reliability Enhanced performance and reduced floor space

Inactive Publication Date: 2013-10-23
INST OF ELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is that the working efficiency of the high-power microwave device test power supply is not high, and the problem that it cannot be quickly protected and operated reliably when the load is ignited

Method used

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  • Test power source for large-power microwave device
  • Test power source for large-power microwave device
  • Test power source for large-power microwave device

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Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0024] It should be noted that the high power referred to below refers to the output power above 10KW, the high voltage refers to the output voltage above 10KV, and the high frequency referred to herein refers to the operating frequency above 10KHz.

[0025] figure 2 It is a schematic diagram of the test power supply for the high-power microwave device of the present invention. Such as figure 2 As shown, the high-power microwave device test power supply is used to output the DC high voltage required for microwave device testing, including: rectifier circuit, high-frequency inverter circuit, boost circuit, high-frequency rectifier circuit, high-voltage sampling circuit, comparative protection circuit and high frequency...

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Abstract

The invention discloses a test power source for a large-power microwave device. The power source is used for outputting a stable direct-current high voltage which is needed in testing of the microwave device. A circuit includes a boosted circuit, a high-frequency rectifying circuit, a high-voltage sampling circuit, a high-frequency inversion circuit and a high-frequency control circuit, which are connected in order. The high-voltage sampling circuit is used for sampling output voltages of the power source and outputting a high-voltage sampling voltage to the high-frequency control circuit. The high-frequency inversion circuit is used for generating high-frequency alternating-current signals which are then transmitted to the boosted circuit. The high-frequency control circuit is used for receiving the high-voltage sampling voltage and generating a control signal to regulate the high-frequency inversion circuit according to the high-voltage sampling voltage so that outputs of the power source are stabilized to a preset value. The test power source for the large-power microwave device enables the stable direct-current voltage to be provided and is relative high in efficiency.

Description

technical field [0001] The invention belongs to the technical field of power distribution devices, and in particular relates to a test power supply for testing high-power microwave devices. Background technique [0002] High-power microwave tubes include klystrons, traveling wave tubes, and gyrotrons. They are an important class of microwave devices. Their main feature is that they can generate microwave energy above KW. They are widely used in broadcast communications, high-energy physics and radar etc. The above-mentioned microwave tube has strict requirements on the test power supply. In order to test the working characteristics of high-power microwave tubes, it is necessary for the test power supply to provide a DC high voltage with a certain degree of stability. And, due to the discrete nature of the load, the output DC voltage should be able to be adjusted within a certain range. At the same time, because the microwave tube load sometimes sparks and causes a short c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02M7/12H02H3/20G01R31/00
Inventor 蔡政平徐旭哲武志勇
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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