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Method for measuring thickness of coating through optical pulse infrared thermal imaging

A technology of infrared thermal imaging and coating thickness, which is applied in measurement devices, optical devices, electrical radiation detectors, etc., can solve problems such as material characteristics limitations, and achieve the effect of simple and easy method and overcoming limitations.

Active Publication Date: 2013-12-25
HEILONGJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the current method of measuring coating thickness has limitations on the measured material properties. The present invention provides a method for measuring coating thickness by optical pulse infrared thermal imaging

Method used

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  • Method for measuring thickness of coating through optical pulse infrared thermal imaging
  • Method for measuring thickness of coating through optical pulse infrared thermal imaging
  • Method for measuring thickness of coating through optical pulse infrared thermal imaging

Examples

Experimental program
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specific Embodiment approach 1

[0014] Specific implementation mode one: combine figure 1 Describe this embodiment, what is described in this embodiment,

[0015] Step 1: Using pulse heating equipment at pulse intensity Q 1 Next, the coating structural member 1 to be tested is heated, and at the same time, the infrared thermal imager 3 is used at the sampling frequency f s Next, collect the heat map sequence T of the surface of the tested coating structural member 1 1 (x, y, N), where x×y is the number of pixels of the infrared thermal imager, and N is the number of image frames collected;

[0016] Step 2: Using pulse heating equipment at pulse intensity Q 2 Next, the coating structural member 1 to be tested is heated, and at the same time, the infrared thermal imager 3 is used at the sampling frequency f s Next, collect the heat map sequence T of the surface of the tested coating structural member 1 2 (x,y,N);

[0017] Step 3: The obtained heat map sequence T 2 (x,y,N) and heatmap sequence T 1 (x, y...

specific Embodiment approach 2

[0037] Embodiment 2: This embodiment is a further limitation of the method for measuring coating thickness by optical pulse infrared thermal imaging described in Embodiment 1.

[0038] The pulse heating device is a high-energy flash lamp 2 .

specific Embodiment approach 3

[0039] Embodiment 3: This embodiment is a further limitation of the method for measuring coating thickness by optical pulse infrared thermal imaging described in Embodiment 1.

[0040] The step 3, step 4 and step 5 are all realized by software embedded in the computer 4 .

[0041] The process of measuring coating thickness by light pulse infrared thermal imaging technology will be described below in conjunction with the examples. In this embodiment, a high-temperature anti-oxidation coating / heat-resistant alloy substrate flat specimen is used, the thickness of the coating is not uniform, and the thermal diffusivity of the coating is α c =2.5×10 -9 m 2 / s. Set the sampling frequency f of the thermal imager 3 s =50Hz. Take the pulse intensity as Q 1 =7.5kW / m 2 and Q 2 =9.5kW / m 2 Perform thermal excitation on the tested part to obtain the heat map sequence T 1 (x,y,N) and T 2 (x,y,N). Will T 2 (x,y,N) and T 1 Subtract (x, y, N) to get △T(x, y, N).

[0042] figure ...

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Abstract

The invention discloses a method for measuring the thickness of a coating through optical pulse infrared thermal imaging, and relates to a method for measuring the thickness of the coating to solve the problem that a current method for measuring the thickness of the coating is limited by the characteristics of measured materials. The method includes the steps of heating a structural element of the measured coating under two different types of pulse strength through a pulse heating device, collecting thermal image sequences T1(x,y,N) and T2(x,y,N) on the surface of the structural element of the measured coating under the same sampling frequency fs through an infrared thermal imager, subtracting the thermal image sequence T1(x,y,N) from the thermal image sequence T2(x,y,N) to obtain a thermal wave signal delta T which is equal to T2(x,y,N) minus T1(x,y,N), conducting linear fitting on the relationships between thermal wave signals of all pixels and collection frame numbers to obtain a delta T(x,y,N) which is equal to aN plus b, and obtaining the coating thickness ec of the structural element of the measured coating according to a formula and according to the obtained a and the obtained b. The method is used for measuring the coating thickness of the structural element of the measured coating.

Description

technical field [0001] The invention relates to a method for measuring coating thickness, in particular to a method for measuring coating thickness by optical pulse infrared thermal imaging. Background technique [0002] Pulse infrared thermal imaging technology is a non-destructive testing technology developed after the 1980s. This method is based on the thermal wave theory, by actively applying pulsed thermal excitation to the measured object, using an infrared thermal imager to continuously observe and record the temperature change on the surface of the object, and processing and analyzing the thermal wave signal through image processing technology, In order to realize the qualitative diagnosis and quantitative identification of the internal discontinuous structure of the object. [0003] At present, the method of measuring coating thickness mainly includes eddy current thickness measurement method, but this method is only suitable for the measurement of metal coating th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06G01J5/10
Inventor 唐庆菊齐立涛刘元林芦玉梅张志平
Owner HEILONGJIANG UNIVERSITY OF SCIENCE AND TECHNOLOGY
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