Drawing Method of Thermal Fatigue Life Curve for Automotive Diode Thermal Cycle Load Test
A load test and life curve technology, applied in the direction of single semiconductor device testing, etc., can solve the problem of lack of predicting the number of thermal cycles of diodes, and achieve the effect of product quality testing and production process improvement
Active Publication Date: 2016-03-23
JINHUA HUAQIANG ELECTRONICS TECH
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[0002] The life sampling inspection of automotive diodes is necessary for all diodes to leave the factory, and it is also of great benefit to the research and development of diodes. It takes at least two years from the factory test of a diode thermal cycle to the actual feedback of the car road test, and the current technology Updates are changing with each passing day. It takes more than two years to test the thermal fatigue life of automotive diodes. However, the existing technology lacks a method for predicting the number of thermal cycles of diodes, that is, the number of thermal fatigue life.
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[0021] The following is figure 1 The embodiment represented by -4 further describes the present invention, and the vehicle diode thermal cycle load test basis is GB / T4023-1997, QCT706-2004, SJ20788-2000 standards. It includes the following steps:
[0022] (1) Carry out the tube test in the above-mentioned diode thermal cycle load test system;
[0023] (2) According to the test data, the forward voltage drop-V F , Reverse leakage current— I RRM, forward transient thermal resistance—ΔVF three parameters and test cycle records, ΔVF=VF1—VF2; VminF I RRM ΔVFmin ΔV F ΔV Fmax , Vmin is the minimum forward voltage drop; Vmax is the maximum forward voltage drop; Imin is the minimum reverse leakage current; Imax is the maximum reverse leakage current; ΔVFmin is the minimum value of forward transient thermal resistance; ΔV Fmax is the maximum value of forward transient thermal resistance;
[0024] VF1 is a constant current at room temperature I m at t 1 time the forwa...
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The present invention is a technical field of a life sampling method for the diodes of the vehicle, which involves the drawing method of the thermal fatigue life curve of a car diode heat circulation load test.It is characterized by: including the following steps: (1) the diode thermal circulation load test test system for diode thermal circulation load test system is performed; (2) F , Reverse leakage current-- I RRM, forward transient thermal resistance -ΔVF three parameters and test cycle records; (3) According to the test results of the steps (2)Value is vertical coordinates, the number of cycles is horizontal coordinates, which constructs a positive and hypertrophic heat life curve, reverse leakage current thermal life curve, transient thermal resistance heat life curve; (4) fitting through three curves to form a carUse diode thermal cycle load to test the heat fatigue life curve.The curve can judge or predict the heat fatigue life of the diode.
Description
technical field [0001] The invention belongs to the technical field of a life sampling inspection method of a vehicle diode, and in particular relates to a method for drawing a thermal fatigue life curve of a vehicle diode thermal cycle load test. Background technique [0002] The life sampling inspection of automotive diodes is necessary for all diodes to leave the factory, and it is also of great benefit to the research and development of diodes. It takes at least two years from the factory test of a diode thermal cycle to the actual feedback of the car road test, and the current technology Updates are changing with each passing day. It takes more than two years to test the thermal fatigue life of automotive diodes. However, the existing technology lacks a method for predicting the number of thermal cycles of diodes, that is, the number of thermal fatigue life. Contents of the invention [0003] The purpose of the present invention is to provide a method for drawing the ...
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IPC IPC(8): G01R31/26
Inventor 金天邹新富赵德施笑琴倪锦喜
Owner JINHUA HUAQIANG ELECTRONICS TECH