Monitoring system and monitoring method for SRAM type FPGA (field-programmable gate array) single particle functional interruption

Abstract

The invention discloses a monitoring system and a monitoring method for SRAM type FPGA single particle functional interruption, and relates to the field of a single particle. The method comprises the steps of: A, setting a heavy ion beam flow with an initial LET value to irradiate a test board; B, judging whether a single particle functional interruption phenomenon happens to the test board, if so, recording that the single particle functional interruption phenomenon happens one time to the test board, and if not, considering that the single particle functional interruption phenomenon does not happen to the test board; C, judging whether the test board satisfies the following condition that the number of the single particle functional interruption phenomenon reaches a predetermined number or the total injection quantity of incident particles reaches a predetermined quantity, if so, performing a step D, and if not, performing the step B; D, judging whether a [sigma]-LET curve can be obtained by means of fitting, if so, obtaining the [sigma]-LET curve by means of fitting, and if not, adjusting the LET value of the heavy ion beam flow and performing the step B. The system and the method provided by the invention are capable of predicting the SEFI rate of an FPGA in various kinds of space environments.

Description

technical field

[0001] The invention relates to the technical field of single event monitoring, in particular to a monitoring system and method for SRAM (static random access memory) type FPGA single event functional interruption. Background technique

[0002] FPGA (Field-Programmable Gate Array, Field Programmable Gate Array) is susceptible to TID effect (total dose effect), SEE effect (single event effect) and other effects in the space radiation environment. SEFI (single event functional interruption) refers to the failure of the control logic of the device caused by the incidence of protons or heavy ions, and then interrupts the normal control function. After a single high-energy particle is incident on the FPGA, the FPGA device is automatically reset and restarted, and cannot be configured. Unable to read back and so on.

[0003] At present, the FPGA manufacturing technology in the United States, Europe and other countries and regions is far ahead in the world. While t...

Examples

Embodiment Construction

[0033] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0034] figure 1 It is a structural schematic diagram of a monitoring system for SRAM-type FPGA single-event functional interruption described in the embodiment of the present invention, as figure 1 As shown, the system includes: a test board 100 , a vacuum target chamber 200 , an effect test unit 400 and a remote monitoring unit 500 .

[0035] Specifically, the test board 100 is placed in the vacuum target chamber 200; inside the vacuum target chamber 200, the test board 100 is connected to the vacuum rotor on the side wall of the vacuum target chamber 200 through a cable. Connector 300; the vacuum adapter 300 is further connected to the effect test unit 400 arranged out...

technical field

[0001] The invention relates to the technical field of single event monitoring, in particular to a monitoring system and method for SRAM (static random access memory) type FPGA single event functional interruption. Background technique

[0002] FPGA (Field-Programmable Gate Array, Field Programmable Gate Array) is susceptible to TID effect (total dose effect), SEE effect (single event effect) and other effects in the space radiation environment. SEFI (single event functional interruption) refers to the failure of the control logic of the device caused by the incidence of protons or heavy ions, and then interrupts the normal control function. After a single high-energy particle is incident on the FPGA, the FPGA device is automatically reset and restarted, and cannot be configured. Unable to read back and so on.

[0003] At present, the FPGA manufacturing technology in the United States, Europe and other countries and regions is far ahead in the world. While t...

Examples

Embodiment Construction

[0033] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0034] figure 1 It is a structural schematic diagram of a monitoring system for SRAM-type FPGA single-event functional interruption described in the embodiment of the present invention, as figure 1 As shown, the system includes: a test board 100 , a vacuum target chamber 200 , an effect test unit 400 and a remote monitoring unit 500 .

[0035] Specifically, the test board 100 is placed in the vacuum target chamber 200; inside the vacuum target chamber 200, the test board 100 is connected to the vacuum rotor on the side wall of the vacuum target chamber 200 through a cable. Connector 300; the vacuum adapter 300 is further connected to the effect test unit 400 arranged out...

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