Monitoring system and monitoring method for SRAM type FPGA (field-programmable gate array) single particle functional interruption

Abstract

The invention discloses a monitoring system and a monitoring method for SRAM type FPGA single particle functional interruption, and relates to the field of a single particle. The method comprises the steps of: A, setting a heavy ion beam flow with an initial LET value to irradiate a test board; B, judging whether a single particle functional interruption phenomenon happens to the test board, if so, recording that the single particle functional interruption phenomenon happens one time to the test board, and if not, considering that the single particle functional interruption phenomenon does not happen to the test board; C, judging whether the test board satisfies the following condition that the number of the single particle functional interruption phenomenon reaches a predetermined number or the total injection quantity of incident particles reaches a predetermined quantity, if so, performing a step D, and if not, performing the step B; D, judging whether a [sigma]-LET curve can be obtained by means of fitting, if so, obtaining the [sigma]-LET curve by means of fitting, and if not, adjusting the LET value of the heavy ion beam flow and performing the step B. The system and the method provided by the invention are capable of predicting the SEFI rate of an FPGA in various kinds of space environments.

Description

technical field [0001] The invention relates to the technical field of single event monitoring, in particular to a monitoring system and method for SRAM (static random access memory) type FPGA single event functional interruption. Background technique [0002] FPGA (Field-Programmable Gate Array, Field Programmable Gate Array) is susceptible to TID effect (total dose effect), SEE effect (single event effect) and other effects in the space radiation environment. SEFI (single event functional interruption) refers to the failure of the control logic of the device caused by the incidence of protons or heavy ions, and then interrupts the normal control function. After a single high-energy particle is incident on the FPGA, the FPGA device is automatically reset and restarted, and cannot be configured. Unable to read back and so on. [0003] At present, the FPGA manufacturing technology in the United States, Europe and other countries and regions is far ahead in the world. While t...

AI Technical Summary

Problems solved by technology

SEFI (single event functional interruption) refers to the failure of the control logic of the device caused by the incidence of protons or heavy ions, and then interrupts the normal control function. After a single high-energy particle is incident on the FPGA, the FPGA device is automatically reset and restarted, and cannot be configured. Unable to read back, etc.

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