Leak detection method of electronic device

An electronic device and leak detection technology, which is applied in the direction of detecting the appearance of fluid at the leak point, using liquid/vacuum degree for liquid tightness measurement, etc., can solve the problems that affect the final result, missed judgment, and misjudgment of leak detection. Achieve the effects of no need for purification treatment, improve efficiency, and save leak detection costs

Inactive Publication Date: 2014-02-05
桂林机床电器有限公司
View PDF4 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] After each decompression, the surface adsorption problem must be surface treated. Whether it is helium or fluorine oil, improper treatment of the purification effect will cause misjudgments or missed judgments in leak detection, affecting the final resul

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Leak detection method of electronic device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0022] Such as figure 1 Shown is a flow chart of a leak detection method for an electronic device according to the present invention, and the steps are as follows:

[0023] Step 1: Put the tested electronic device into a pressurized container, and after the container is evacuated, pressurize the device with 99.999% high-pressure tracer gas helium, and the helium gas is pressed into the device through the leak hole on the device lumen;

[0024] Step 2: After the pressure treatment is completed, immerse the electronic device directly in light fluorine oil, and judge by observing whether the device is bubbling;

[0025] Step 3: Put the tested electronic device that has passed the bubbling into the vacuum container, a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to the technical field of electronic circuits, in particular to a leak detection method of an electronic device. The method includes the following steps that the electronic device to be detected is placed into a pressurizing container, and after the container is vacuumized, pressurizing is carried out on the electronic device through high-pressure tracer gas helium with the purity of 99.999%; after pressurizing is finished, the electronic device is directly soaked in light fluorocarbon oil, and judgment is carried out by observing whether the electronic device bubbles; the detected electronic device which is qualified in bubbling is placed into a vacuum container, and leakage rate testing and judging are carried out by means of a helium mass spectrometer vacuum leak detection method. By means of the leak detection method, on the situation that original equipment is used, leak detection efficiency is improved, purifying is not needed, new defects are avoided, and meanwhile leak detection cost is saved.

Description

technical field [0001] The invention relates to the technical field of electronic circuits, in particular to a leak detection method for electronic devices. Background technique [0002] Electronic components are an indispensable part of electronic products, and their quality directly affects the quality of various equipment. Electronic products must have the ability to resist external environment corrosion, so many electronic devices are required to be sealed. This first prevents the chips and circuits in the device from communicating with the external environment, especially those with high humidity, so as to avoid electrolytic corrosion and change the electrical parameters of the device, resulting in performance degradation, and even serious damage to the device. The fusing structure is damaged and the device is scrapped. Secondly, some devices are required to work under a certain gas protection, or work in a vacuum environment, or when the device is required to be seal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01M3/06G01M3/20
Inventor 周泰武李文礼彭应光万文华
Owner 桂林机床电器有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products