Photoinduced deformation thin film reflector surface shape control and measurement device

A thin-film mirror and photodeformation technology, applied in the field of space optics, can solve the problems of poor surface shape control accuracy, low system reliability, and complex system, and achieve the effect of high surface shape control accuracy and improved reliability.

Active Publication Date: 2014-02-12
CHANGCHUN UNIV OF SCI & TECH
View PDF4 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problem that the surface shape control and measuring device system of the existing photodeformable thin film reflector is complex, and the two-dimensional pendulum mirror in the surfa

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Photoinduced deformation thin film reflector surface shape control and measurement device
  • Photoinduced deformation thin film reflector surface shape control and measurement device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0023] Such as figure 2 As shown, the surface shape control and measuring device of the photodeformable film mirror of the present invention includes a film support frame 7, a photodeformable film 8, a film boundary displacement controller 9, a birefringent prism 10, a polarization rotator 11, a liquid crystal Spatial light modulator 12, beam splitting prism 13, polarization state controller 14, free space optical isolator 15, intensity phase modulator 16, first laser collimating mirror 17, laser 18, second laser collimating mirror 19 and photoelectric detection device 20.

[0024] The film support frame 7 fixes the periphery of the photodeformable film 8 and keeps it in a flat state, and the film boundary displacement controller 9 is used to adjust the film boundary displacement to achieve the purpose of adjusting the pretension of the film, thereby...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a photoinduced deformation thin film reflector surface shape control and measurement device, and belongs to the technical field of space optics. In order to solve the problems that an existing photoinduced deformation thin film reflector surface shape control and measurement device is complex in system, a surface shape control system is low in reliability, and the surface shape control accuracy is poor, the photoinduced deformation thin film reflector surface shape control and measurement device is characterized in that lasers transmitted by a laser device pass through a first laser collimating mirror to obtain collimating lasers, then adjustment on the polarization direction and the polarization state is completed through a free space optical isolation device and a polarization state controller to obtain single-polarization-state collimating lasers, the collimating lasers enter a liquid crystal space modulator through a laser splitter prism to conduct small-angle deflection, the deflecting directions of the collimating lasers are changed through a polarization rotator, then the collimating lasers are scanned by a birefringent prism to be output to the surface of a photoinduced deformation thin film to complete thin film tensile deformation, the lasers are scattered back through the photoinduced deformation thin film to enter a second laser collimating mirror through the birefringent prism, the polarization rotator, the liquid crystal space modulator and the laser splitter prism, and the lasers can be gathered through the second laser collimating mirror to reach a photoelectric detector.

Description

technical field [0001] The invention relates to a surface shape control and measurement device of a light-induced deformation thin film mirror, which belongs to the technical field of space optics. Background technique [0002] The space mirror based on the flexible film (referred to as the film mirror) has the advantages of low cost, small storage volume, expandability, light weight, etc., which solves the contradiction between large aperture, launch weight and carrying volume It satisfies the development requirements of ultra-large and ultra-lightweight mirrors. Its related theoretical and technical research has developed rapidly in recent years and has become one of the research hotspots in the field of space technology at home and abroad. It has shown good application prospects in the fields of large-scale space optical systems and antennas. [0003] Existing thin film mirrors can be divided into several categories according to the external force used, such as inflatabl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01B11/24G05B19/04
Inventor 张鹏王天枢佟首峰姜会林
Owner CHANGCHUN UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap