Test bed for visual measurement system of test piece high temperature deformation machine
A technology of machine vision measurement and high temperature deformation, applied in measurement devices, instruments, optical devices, etc., can solve the problem of difficulty in meeting the application diversity of machine vision inspection and measurement technology, difficult to carry out teaching and scientific research work effectively, and no experimental research instruments. or means to achieve the effect of friendly interface, satisfying application diversity and intuitive layout
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0012] Further describe the present invention below in conjunction with embodiment and accompanying drawing thereof. The examples are only used to further describe the present invention in detail, and do not limit the protection scope of the claims of the present application.
[0013] Test piece high-temperature deformation machine vision measurement system test bench (abbreviation test bench, see Figure 1-3 ), characterized in that the test bench includes three parts: a heating furnace part, a visual inspection part and a control system part. The heating furnace part includes a heating furnace 1, a heating furnace shell 11, a heating furnace inner cavity 12, a blower 3, two air ducts 9, two air duct covers 4, two quartz glass windows 5, thermal insulation materials 6, two Infrared heating tube 7 and a test piece table 8; the shell 1 of the heating furnace is a hexahedron, the inner wall and outer wall of the heating furnace are welded by stainless steel plates, and are all ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com