Device and method used for measuring deformation of diamond anvil under high temperature high pressure condition

Abstract

The device relates to the non-contact measuring field and particularly relates to a device and a method used for measuring deformation of a diamond anvil under the high temperature high pressure condition. The method and the device are provided according to the technical problems existing in the prior art. Specifically, deformation of the diamond anvil under the high temperature high pressure condition is acquired through a probe light emission light path, a signal reception light path and a signal processing computer; broad band probe light is provided by the probe light emission light path, signal light returned back from a front table top of the diamond anvil and reference light returned from a back table top of the diamond anvil are collected by the signal reception light path, and frequency spectrum interference of the two light beams is generated in a fiber spectrometer of the signal reception light path; a frequency spectrum interference signal outputted by the fiber spectrometer is processed by the computer, and deformation of the diamond anvil under the high temperature high pressure condition is acquired.

Description

technical field [0001] The invention relates to the field of non-contact measurement, in particular to a device and method for measuring deformation of a diamond anvil under extreme high temperature and high pressure conditions. Background technique [0002] The invention and application of the diamond press (DAC) is a major breakthrough in the field of static high pressure experimental research, and it is also the most common high pressure generating device in the field of static high pressure research. Its ability to generate ultra-high pressure provides people with a deeper understanding of the extreme high temperature of matter Possibility of physical and chemical properties under high pressure conditions. With the help of DAC loading technology, people have carried out studies on the phase transition, state equation, intensity, sound velocity, optical properties, magnetic properties, and electrical properties of substances under extreme high temperature and high pressur...

AI Technical Summary

Problems solved by technology

The deformation of the diamond anvil under high pressure is mainly evaluated by finite element numerical simulation, X-ray transmission imaging and contact micrometer measurement; the finite element numerical simulation depends on the established model and the characteristics of the diamond anvil and the gasket material parameters, the X-ray transmission imaging method requires a high-brightness synchrotron radiation light source and consumes a lot of precious synchrotron radiation machine hours, and the micrometer measurement method is a contact measurement with limited measurement accuracy, and cannot give the shape of the deformation of the anvil table

To sum up, there is currently no effective method to measure the deformation of diamond anvils under high temperature and high pressure, and it is difficult to meet the requirements of in-situ accurate measurement of sample thickness under DAC loading conditions.

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