Fan testing fixture

A technology for fan testing and fixtures, applied in pump testing, pump control, liquid variable capacity machinery, etc., which can solve problems such as engineer interference, short circuit of mainboard power supply, and fast fan speed.

Inactive Publication Date: 2014-07-02
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the test, the engineer needs to hold the probe tightly so that the probe can touch the interface between the fan and the motherboard well. At the same time, the fan rotates fast, which generates a lot of noise, which greatly disturbs the engineer.
When performing a signal test, the ground wire of the probe needs to touch the ground pin, and the distance between the ground pin and the power pin of the fan interface is small, which makes it very easy for the probe ground wire to touch at the same time during the test The ground pin and the power pin will cause the power supply of the motherboard to be short-circuited to the ground, and the motherboard will be burned.
Moreover, when performing signal integrity measurements, it is usually necessary to test the signal quality of the PWM signal at different duty cycles, and the adjustment method usually requires modifying the register, which is cumbersome

Method used

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  • Fan testing fixture

Examples

Experimental program
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Embodiment Construction

[0015] Please refer to figure 1 A preferred embodiment of the fan test fixture 10 of the present invention includes a connector 101, a power test unit 102, a signal test unit 103, a single-chip microcomputer 104, a pulse width modulation signal duty cycle display 105, a speed signal display 106 and a keyboard 107.

[0016] The connector 101 includes a ground pin 201 , a power pin 202 , a speed signal pin 203 and a pulse width modulation signal pin 204 . The connector 101 is used to connect with the fan interface on the motherboard to be tested.

[0017] The power test unit 102 includes a first contact 205 and a second contact 206, the first contact 205 is connected to the ground pin 201 of the connector 101, and the second contact 206 is connected to the power supply of the connector 101 Pin 202 is connected.

[0018] The signal testing unit 103 includes a third contact 207 and a fourth contact 208 , the third contact 207 is connected to the first contact 205 . Since the fi...

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PUM

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Abstract

A fan test device is connected to an interface of a fan under test on a motherboard. The fan test device includes a connector, a power test unit, a signal test unit, a single chip microcontroller (SCM), and a keyboard. The power test unit includes a first contact and a second contact. The first contact is connected to a ground pin of the connector. The second contact is connected to a power pin of the connector. The signal test unit includes a third contact and a fourth contact. The third contact is connected to the first contact. The fourth contact is connected to a pulse width modulation (PWM) signal pin of the connector. The keyboard is connected to the SCM to input a max speed and a preset duty cycle of the fan.

Description

technical field [0001] The invention relates to a test fixture, in particular to a fan test fixture. Background technique [0002] The fan test is to verify whether the control signal and voltage of the fan on the motherboard meet the chip specification and system design requirements when the fan is working. When the temperature of the motherboard changes, the fan can be dynamically adjusted, that is, whether the fan speed can be changed. The motherboard adjusts the fan PWM (pulse width modulation) signal to change the fan speed, and at the same time, the fan feeds the speed signal back to the motherboard to realize the closed control process. From the perspective of signal integrity, it is necessary to verify the PWM signal received by the fan and the speed signal received by the main board BMC (Baseboard Management Controller). The existing test scheme is to use a probe to directly detect at the motherboard fan interface. The motherboard fan interface includes 4 pins, wh...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): F04D27/00
CPCF04D27/001F04B51/00F04D27/00
Inventor 匡湘文
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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