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Nonlinear coefficient measurement device and method based on small-scale self-focusing growth of noise

A nonlinear coefficient, small-scale technology, applied in the field of nonlinear optics, can solve the problems of low accuracy, large limitations of coherent imaging technology, and inability to real-time synchronous measurement

Active Publication Date: 2017-01-25
HUNAN UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

However, this method requires the sample to move multiple times in the direction of laser transmission, which is easy to cause damage to thin films and easily damaged materials, and this method cannot measure nonlinear media with large thickness.
The 4f system coherent imaging technology has limitations and low accuracy, which limits its wide application
The current measurement method is to first measure the nonlinear coefficient of the material under a certain laser characteristic parameter, and then use the measured parameters to carry out research, and cannot perform real-time simultaneous measurement under the required specific laser characteristics.

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  • Nonlinear coefficient measurement device and method based on small-scale self-focusing growth of noise
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  • Nonlinear coefficient measurement device and method based on small-scale self-focusing growth of noise

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Embodiment Construction

[0021] The present invention will be described in detail below in conjunction with specific embodiments and accompanying drawings.

[0022] Such as figure 1 As shown, the non-linear coefficient measurement device based on noise small-scale self-focus growth in this embodiment includes an ultrashort pulse light source 1, optical attenuation sheets 2a-2b, filament 3, nonlinear medium 4, and precision detector 5.

[0023] The functions of the above parts are described as follows:

[0024] The ultrashort pulse light source 1 is used to generate femtosecond pulses, and calculate the nonlinear coefficient of the medium by measuring the nonlinear growth gain of the modulated beam under different powers;

[0025] The optical attenuation sheet 2a is used to adjust the power of the ultrashort pulse incident into the nonlinear medium;

[0026] The optical attenuation sheet 2b is used to adjust the power incident to the precision detector CCD to avoid damage to the CCD due to excessive ...

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Abstract

The invention discloses a nonlinear coefficient measuring device and method based on noise small-scale self-focusing growth. The nonlinear coefficient measuring device based on noise small-scale self-focusing growth comprises an ultra-short pulse light source, an optical attenuation piece, a thin filament, nonlinear media and a precision detector. Compared with the traditional method, the device is simple in light path, capable of performing real-time synchronous measurement under the condition of high laser power, large-thickness media and single-time scanning, and high in measuring precision.

Description

technical field [0001] The invention relates to the field of nonlinear optics, in particular to a nonlinear coefficient measurement device and method based on noise small-scale self-focus growth. Background technique [0002] Because nonlinear optical materials have great application prospects in the fields of optical communication and optical information processing, people's research on nonlinear optical materials is becoming more and more extensive. Optical nonlinear measurement technology is one of the key technologies for the study of nonlinear optical materials. Currently, commonly used nonlinear coefficient measurement methods include Z-scan technology, four-wave mixing method, 4f system coherent imaging technology, ellipsometry, etc. Due to the advantages of simple device and high sensitivity, Z-scan technology has become the most commonly used method for measuring the nonlinearity of materials. However, this method requires the sample to move multiple times in the d...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
Inventor 傅喜泉谭超
Owner HUNAN UNIV