Screening method for chip solid electrolyte tantalum capacitors

Abstract

The invention discloses a screening method for chip solid electrolyte tantalum capacitors. The method comprises the following steps: (1) connecting a capacitor to the output terminal of a digital source meter; (2) connecting an oscilloscope to the output terminal of the digital source meter; (3) carrying out constant-current charging; (4) carrying out pressure resistance screening test; and (5) carrying out pressure resistance assessment test on the capacitor having undergone pressure resistance screening test. The invention has the following beneficial effects: through pressure resistance screening test, capacitors with good pressure resistance can be picked out and capacitors with poor pressure resistance can be eliminated without damage to the capacitors, so it is ensured that capacitors consigned to users have best pressure resistance and usage reliability of the capacitors is improved; through pressure resistance assessment test, batch pressure resistance of capacitors can be assessed, so it is ensured that batches of capacitors with undesirable pressure resistance are not consigned to users for usage; and the method has the characteristics of simple testing, convenient operation, convenience, easy practicability and obvious effects.

Description

technical field [0001] The invention relates to a screening method for chip-type solid electrolyte tantalum capacitors, belonging to the technical field of capacitor quality and reliability evaluation. Background technique [0002] Chip solid electrolytic tantalum capacitors are widely used in various high-end electronic equipment due to their small size, large capacity, good temperature characteristics, high stability and reliability. Although a series of screening tests and tests have been passed, some capacitors still fail to break down in the actual use process. The main reason is that the traditional screening test methods such as voltage aging and electrical performance parameter testing cannot be completely eliminated. For capacitors with low withstand voltage, it is also difficult to distinguish the difference in withstand voltage between batches of capacitors, which leads to breakdown and short circuit failure of individual capacitors or batches of capacitors with l...

AI Technical Summary

Problems solved by technology

Although a series of screening tests and tests have been passed, some capacitors still fail to break down in the actual use process. The main reason is that the traditional screening test methods such as voltage aging and electrical performance parameter testing cannot be completely eliminated. For capacitors with low withstand voltage, it is also difficult to distinguish the difference in withstand voltage between batches of capacitors, resulting in breakdown and short-circuit failure of individual capacitors or batches of capacitors with low withstand voltage under the cumulative effect of post-stress

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