Screening method for chip solid electrolyte tantalum capacitors

A solid electrolyte, tantalum capacitor technology, applied in sorting and other directions, can solve the problems of inability to completely eliminate capacitors with low withstand voltage, difficult to distinguish the difference in withstand voltage between capacitor batches, capacitor breakdown failure, etc., to achieve simple testing. , easy to operate, improve the effect of reliability

Active Publication Date: 2014-08-20
CHINA ZHENHUA GRP XINYUN ELECTRONICS COMP ANDDEV CO LTD
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Problems solved by technology

Although a series of screening tests and tests have been passed, some capacitors still fail to break down in the actual use process. The main reason is that the traditional screening test methods such as voltage aging and electrical performance parameter testing cannot be completely eliminated. For capa

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  • Screening method for chip solid electrolyte tantalum capacitors
  • Screening method for chip solid electrolyte tantalum capacitors
  • Screening method for chip solid electrolyte tantalum capacitors

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[0018] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings, but the scope of protection is not limited to the above.

[0019] A screening method for chip solid electrolyte tantalum capacitors, which includes the following steps:

[0020] (1), such as figure 1 , Connect the chip solid electrolyte tantalum capacitor to be tested to the output terminal of the digital source meter;

[0021] (2) Connect the oscilloscope or the output terminal of the digital source meter, use the oscilloscope to observe and record the voltage changes at both ends of the capacitor, so that the oscilloscope is in a monitoring state;

[0022] (3) Start the digital source meter and charge the chip solid electrolyte tantalum capacitor with constant current through the digital source meter, and it can be observed that the voltage across the capacitor rises linearly;

[0023] (4) Conduct withstand voltage screening test: the tested capacitor i...

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Abstract

The invention discloses a screening method for chip solid electrolyte tantalum capacitors. The method comprises the following steps: (1) connecting a capacitor to the output terminal of a digital source meter; (2) connecting an oscilloscope to the output terminal of the digital source meter; (3) carrying out constant-current charging; (4) carrying out pressure resistance screening test; and (5) carrying out pressure resistance assessment test on the capacitor having undergone pressure resistance screening test. The invention has the following beneficial effects: through pressure resistance screening test, capacitors with good pressure resistance can be picked out and capacitors with poor pressure resistance can be eliminated without damage to the capacitors, so it is ensured that capacitors consigned to users have best pressure resistance and usage reliability of the capacitors is improved; through pressure resistance assessment test, batch pressure resistance of capacitors can be assessed, so it is ensured that batches of capacitors with undesirable pressure resistance are not consigned to users for usage; and the method has the characteristics of simple testing, convenient operation, convenience, easy practicability and obvious effects.

Description

technical field [0001] The invention relates to a screening method for chip-type solid electrolyte tantalum capacitors, belonging to the technical field of capacitor quality and reliability evaluation. Background technique [0002] Chip solid electrolytic tantalum capacitors are widely used in various high-end electronic equipment due to their small size, large capacity, good temperature characteristics, high stability and reliability. Although a series of screening tests and tests have been passed, some capacitors still fail to break down in the actual use process. The main reason is that the traditional screening test methods such as voltage aging and electrical performance parameter testing cannot be completely eliminated. For capacitors with low withstand voltage, it is also difficult to distinguish the difference in withstand voltage between batches of capacitors, which leads to breakdown and short circuit failure of individual capacitors or batches of capacitors with l...

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Application Information

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IPC IPC(8): B07C5/344
Inventor 潘齐凤黄小山贾新虎邓瑞雪刘婷何晓舟
Owner CHINA ZHENHUA GRP XINYUN ELECTRONICS COMP ANDDEV CO LTD
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