Transient Delay Test Method of Analog Combining Unit Based on Frequency Sweep
A frequency sweep, delay test technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problem of not being able to meet the requirements of the transient delay test of the merged unit well, to eliminate the test error, improve the Sampling accuracy and versatility
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[0023] The specific embodiment of the present invention will be further described below in conjunction with accompanying drawing:
[0024] refer to Figure 1-3 , a method for testing the transient delay of an analog merging unit based on frequency scanning, comprising the following steps:
[0025] A. Determine the starting moment of the entire transient process by real-time discrimination of the received standard source signal and the measured signal for the sudden change;
[0026] B. From the initial moment of the sudden change of the transient current, the waveform signals of the standard source signal and the measured signal are respectively collected according to the duration of the decay time constant;
[0027] The data window of the transient delay test of the merging unit is obtained through the decay constant of the transient current, that is, the waveform of the decay time constant duration is used as the calculation object from the initial moment of the sudden chang...
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