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Dry etching equipment and method thereof

A dry etching and equipment technology, applied in the field of dry etching equipment, can solve the problem of insufficient uniformity of the dry etching process, and achieve the effects of improving product quality and yield, reducing restrictions, and improving uniformity

Active Publication Date: 2014-09-03
TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] Aiming at the problem that the uniformity of the dry etching process in the prior art is not high enough, the present invention provides a dry etching equipment, including:

Method used

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  • Dry etching equipment and method thereof
  • Dry etching equipment and method thereof
  • Dry etching equipment and method thereof

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Embodiment Construction

[0042] The implementation of the present invention will be described in detail below in conjunction with the accompanying drawings and examples, so as to fully understand and implement the process of how to apply technical means to solve technical problems and achieve technical effects in the present invention. It should be noted that, as long as there is no conflict, each embodiment and each feature in each embodiment of the present invention can be combined with each other, and the formed technical solutions are all within the protection scope of the present invention.

[0043] In the integrated circuit manufacturing process of electronic equipment, it is often necessary to define the entire circuit pattern on the surface of the workpiece. The manufacturing procedure is usually to cover a layer of film on the surface of the workpiece to be processed, and then use photolithography to define a circuit pattern with photoresist on this layer of film, and then use chemical or phys...

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Abstract

The invention discloses a set of dry etching equipment which comprises an etching chamber and an air exhausting system that is arranged at the bottom of the etching chamber. The air exhausting system comprises the components of: an air exhausting channel which is provided with a plurality of air exhausting openings and air discharging openings, an air exhauster, and controllable valves which are respectively mounted on each air exhausting openings. The invention further discloses a dry etching method which comprises the following steps: placing a workpiece to be etched into a base station in the etching chamber; selecting an air exhausting mode according to a step to be performed, wherein the air exhausting modes comprises a circulating operation mode and a non-circulating operation mode; and performing the dry etching step when air exhausting is performing according to the circulating operation mode or the non-circulating operation mode. The dry etching equipment according to the invention has functions of: further improving homogeneity of the dry etching process, improving homogeneity in manufacture of an array substrate, improving product quality and yield rate, reducing restriction of process homogeneity to product design, and improving product design space.

Description

technical field [0001] The invention relates to the field of semiconductor processing, in particular to a dry etching device and method. Background technique [0002] With the development of the information society, people's demand for display devices has increased, which has also promoted the rapid development of the LCD panel industry, and the output of panels has continued to increase. The etching process is an important step in the process of manufacturing a Thin Firm Transistor Liquid Crystal Display (TFT-LCD for short) array substrate. The etching process is divided into a dry etching process and a wet etching process according to the physical state of the etchant, that is, the dry etching process is an etching process using an etching gas, and the wet etching process is an etching process using an etching liquid. [0003] In the process of TFT-LCD manufacturing by dry etching process, ideally the etching gas is completely perpendicular to the The direction of the su...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/305H01J37/30H01L21/3065
CPCG02F1/1303H01J37/32449H01J37/32834H01J2237/334H01J37/32009
Inventor 柴立
Owner TCL CHINA STAR OPTOELECTRONICS TECH CO LTD
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