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Analysis system and sample analyzing method

An analysis system and quality analysis technology, applied in the field of analysis systems and analysis samples, can solve problems such as arc generation, high noise, short service life of electron multipliers and power supplies

Active Publication Date: 2014-09-17
PURDUE RES FOUND INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the efficiency of the API itself is not improved, the final ion flux to the mass analyzer is significantly increased
However, at high voltages, the possibility of arcing in vacuum increases, which results in high noise and short lifetimes of electron multipliers and power supplies

Method used

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  • Analysis system and sample analyzing method
  • Analysis system and sample analyzing method
  • Analysis system and sample analyzing method

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Experimental program
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Embodiment Construction

[0052] For ion trap type mass spectrometers, the pumping capacity cannot be efficiently utilized with conventional normally open APIs. Ions are typically allowed to enter the ion trap for only a portion of each scan cycle, however neutrals are constantly leaking into the vacuum manifold and need to be pumped away to maintain the low pressures typically required for mass analysis. Although mass analysis using ion traps typically requires an ideal pressure of a few millitorr or less, ions can be trapped at pressures much higher than this ideal pressure. (Shaffer, S.A.; Tang, K.Q.; Anderson, G.A.; Prior, D.C.; Udseth, H.R.; Smith, R.D. Rapid Communications in Mass Spectrometry1997, 11, 1813-1817) Using this property of ion traps, an alternative Atmospheric pressure interface, the Discontinuous Atmospheric Pressure Interface (DAPI), to achieve maximum ion transmission at the specified pumping capacity of a mass spectrometer with ion trapping components. The concept of a discrete ...

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Abstract

The invention relates to an analysis system. The system comprises an ionization source, which is used to generate a continuous flow of gas-phase ions; a discontinuous atmospheric connector, which is used to receive the gas-phase ions from the ionization source; and a small mass analyzer, which is used to discontinuously receive the ions from the discontinuous atmospheric connector, of a small mass spectrometer wherein the ions do not need to pass through any vacuum grade. By the structure mentioned above, the mass analyzer can discontinuously communicate with the atmosphere for a while, and thus the pressure in the mass analyzer can be increased until the pressure in the mass analyzer is higher than a pressure under which mass analysis or ion manipulation can be carried out. When the mass analyzer is vacuumized until mass analysis or ion manipulation can be performed in the mass analyzer, the mass analyzer is discontinuously prevented from receiving any ion. The invention further relates to a sample analyzing method.

Description

[0001] This application is a divisional application of a patent application with an application date of May 30, 2008, an application number of 200880101096.3, and an invention title of "Discontinuous Atmospheric Pressure Interface". [0002] related application [0003] This application claims priority to U.S. Provisional Patent Applications Nos. 60 / 941,310 and 60 / 953,822, filed with the U.S. Patent and Trademark Office on June 1, 2007, and August 3, 2007, respectively, hereby adopted The entire contents of the two aforementioned US Provisional Patent Applications are hereby incorporated by reference. [0004] governmental support [0005] At least a portion of the invention described herein was supported by the U.S. Department of Homeland Security (grant number: HSHQPA-05-9-0033). The government has certain rights in this invention. technical field [0006] The present invention generally relates to improvements in the introduction of ions into mass spectrometers. Backgr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/04H01J49/24H01J49/00
Inventor Z·欧阳L·高罗伯特·格雷厄姆·库克斯
Owner PURDUE RES FOUND INC