Material complex permittivity testing system and method with open-hole short-circuit board

Abstract

The invention discloses a material complex permittivity testing system and method with open-hole short-circuit boards, belonging to the technical field of microwave and millimeter wave material electromagnetic parameter testing. Test equipment, including sequentially connected coaxial cables to rectangular waveguide conversion joints, isolators, two-way couplers, rectangular waveguides and open-hole short circuit boards; the test signal output by the vector network analyzer passes through the signal input coaxial cable and coaxial cable Connected to the conversion joint of the rectangular waveguide, the coupling end of the bidirectional coupler away from the short circuit board outputs the test signal through the signal output coaxial cable and is input to the vector network analyzer, and the coupling end of the bidirectional coupler close to the short circuit board is connected with a matching load. The complex dielectric constant testing system provided by the invention can conveniently pick and place test samples, reduce the system error of the rectangular waveguide terminal short-circuit method testing system, and improve the testing efficiency and the service life of the testing system.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic parameter testing of microwave and millimeter wave materials, in particular a system and method for testing the complex dielectric constant of microwave dielectric materials based on a terminal short circuit method. Background technique [0002] As an electromagnetic wave transmission medium, microwave dielectric materials have been widely used in aerospace, microwave circuits, communications, missile guidance, electronic countermeasures, stealth technology, biomedicine, remote sensing and telemetry, etc. Therefore, mastering the parameters of microwave dielectric materials for its research and development, production and use has extremely great significance. The terminal short circuit method is to fill the sample of the dielectric material to be tested in the transmission line with the terminal short circuit, and calculate the complex dielectric constant of the sample by testing the compl...

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Problems solved by technology

Based on this method, there are the following points: 1. The short-circuit board needs to be disassembled to take out the sample for each test, which is inconvenient to operate; 2. For high-temperature testing, materials that can withstand high temperatures are used to make waveguides, short-circuit boards and screws. The mechanical properties of these materials are not good, and it may cause damage to the waveguide and short-circuit board after repeated disassembly, which will affect the test, especially the screws are very easy to damage; 3. Since the short-circuit board is close to the waveguide, the size of the sample and the size of the inner wall of the waveguide Rather, an air column will be formed between the sample and the short circuit board every time the sample is placed, which is not convenient for the sample to be placed, and even causes an air layer to form between the sample and the short circuit board, which will greatly affect the test results

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