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Temperature control circuit

A temperature control and circuit technology, applied in the field of mass spectrometers, can solve the problems of lack of temperature sensor open circuit detection function, lack of refrigeration chip overcurrent protection and open circuit detection function, etc., to achieve the effect of preventing accidental damage

Active Publication Date: 2014-10-15
JIANGSU SKYRAY INSTR
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The sampling system generally includes an atomizer and a spray chamber, and the spray chamber needs to be temperature controlled. At present, the existing spray chamber controllers use Peltier effect semiconductor refrigeration chips, and mainly use PWM technology to control the temperature of the spray chamber. The temperature is adjusted, however, the existing control method uses a constant voltage source to supply power to the refrigerating sheet, which lacks overcurrent protection and open circuit detection functions for the refrigerating sheet, and also lacks an open circuit detection function for the temperature sensor

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Embodiment Construction

[0041] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments It is only a part of the embodiments of the present invention, not all of the embodiments.

[0042] Regarding the “coupling” used in this text, it can refer to the direct connection of two modules (or units, elements), or the indirect connection of two modules (or units, elements), that is, between two modules (or units, elements) There are other modules (or units, components).

[0043] Reference figure 1 , figure 1 It shows a schematic diagram of a temperature control circuit according to an embodiment of the present invention.

[0044] In this embodiment, the temperature control circuit 1 is used to control the temperature of th...

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Abstract

The invention discloses a temperature control circuit used for controlling a temperature of an atomizing chamber of a mass spectrometer sampling system. The atomizing chamber is provided with refrigerating sheets; the temperature control circuit comprises a program-controlled constant current source module used for providing a constant current power supply for the refrigerating sheets, a temperature sensor module used for acquiring a real-time temperature inside the atomizing chamber to obtain a temperature sampling signal, an analogue-digital conversion module coupled with the temperature sensor module and used for performing analogue-digital conversion on the temperature sampling signal, and a control module coupled between the program-controlled constant current source module and the analogue-digital conversion module and used for controlling output of the program-controlled constant current source module based on a value of the temperature sampling signal after being converted by the analogue-digital conversion module. The temperature control circuit realizes online circuit break detection function on the refrigerating sheets and the temperature sensor at the same time, and therefore can improve reliability and self-checking capability of the temperature control.

Description

Technical field [0001] The invention relates to a mass spectrometer, in particular to a temperature control circuit for controlling the temperature of an atomization chamber in the mass spectrometer. Background technique [0002] Inductively coupled plasma mass spectrometry (ICP-MS) is an analysis and testing technology that developed rapidly in the 1970s. Its principle is to use inductively coupled plasma to ionize the elements contained in the analysis sample into charged ions through an ion transmission system The charged ions are introduced into the mass analyzer and separated according to different mass-to-charge ratios. After the ion current is amplified by the detector, the measurement and control system processes the analysis result. Compared with other analytical techniques, the ICP-MS has the advantages of low detection limit, wide linear range, rapid simultaneous detection of various elements, and the like. With the expansion of the application range, ICP-MS has devel...

Claims

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Application Information

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IPC IPC(8): G05D23/20
Inventor 刘召贵李林丁志国粟舜地周立
Owner JIANGSU SKYRAY INSTR
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