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System and method for testing light-emitting diode response characteristics

A light-emitting diode and testing system technology, which is applied in the direction of single semiconductor device testing, etc., can solve problems such as large measurement errors, insufficiently systematic testing methods, and low efficiency, and achieve the effect of rapid measurement

Inactive Publication Date: 2014-12-03
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Problems solved by technology

However, the existing test methods for the response characteristics of light-emitting diodes are not systematic enough, and cannot measure the photoresponse and electrical response characteristics of light-emitting diodes at the same time; The response is not only inefficient but also introduces large measurement errors

Method used

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  • System and method for testing light-emitting diode response characteristics
  • System and method for testing light-emitting diode response characteristics
  • System and method for testing light-emitting diode response characteristics

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Embodiment Construction

[0019] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be noted that, in the drawings or descriptions of the specification, similar or identical parts all use the same figure numbers. Implementations not shown or described in the accompanying drawings are forms known to those of ordinary skill in the art. Additionally, while illustrations of parameters including particular values ​​may be provided herein, it should be understood that the parameters need not be exactly equal to the corresponding values, but rather may approximate the corresponding values ​​within acceptable error margins or design constraints. The directional terms mentioned in the embodiments, such as "upper", "lower", "front", "rear", "left", "right", etc., are only referring to the directions of the...

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Abstract

The invention provides a system and method for testing light-emitting diode response characteristics. The testing system comprises a computer modulation module, a pulse voltage generation module and a data collection module. The computer modulation module is used for distributing pulse voltage parameters and analyzing received light response data and electric response data. The pulse voltage generation module is connected to the computer modulation module and used for generating pulse voltage according to the pulse voltage parameters distributed by the computer modulation module and loading the pulse voltage to a light-emitting diode to be tested. The data collection module is used for collecting the light response data and the electric response data of the light-emitting diode to be tested and uploading the light response data and the electric response data to the computer modulation module. The light-emitting diode to be tested is connected to the pulse voltage generation module and emits light under the drive of the pulse voltage generated by the pulse voltage generation module. According to the system and method for testing the light-emitting diode response characteristics, the light response and the electric response of the light-emitting diode can be simultaneously and rapidly tested under the impulse voltage.

Description

technical field [0001] The invention relates to the measurement field of optoelectronic devices, in particular to a test system and method for the response characteristic of a light emitting diode. Background technique [0002] A light-emitting diode is a semiconductor diode that can convert electrical energy into light energy, including inorganic electroluminescent diodes (LEDs) composed of inorganic materials and organic electroluminescent diodes (OLEDs) composed of organic materials. Light-emitting diodes have the advantages of small size, low working voltage, small working current, uniform and stable light emission, fast response speed, high efficiency and energy saving, no pollution, and adjustable light emission wavelength. It has been widely used in lighting and display fields, and has wide application prospects in fast response systems. [0003] In the field of display applications, the voltage response characteristic of light-emitting diodes is an important paramet...

Claims

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Application Information

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IPC IPC(8): G01R31/26
Inventor 牛立涛关敏楚新波李弋洋曾一平
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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