Novel analog circuit early fault diagnosis method

Abstract

A novel analog circuit early fault diagnosis method includes the steps of (1) acquiring time domain response signals of an analog circuit and taking the time domain response signals as output voltage signals of the analog circuit; (2) performing wavelet transform to the acquired voltage signals; (3) performing fractal analysis to original signal patterns and wavelet sub patterns to generate wavelet fractal dimensions of different patterns; (4) performing kernel entropy component analysis to candidate feature vector data composed of the wavelet fractal dimensions to acquire low-dimension feature vector data; (5) creating a multi-class classifier of a least squares support vector machine, and optimally selecting penalty factor and width factor of the least squares support vector machine, which are used for distinguishing overlapped early fault categories, by a quantum-behaved particle swarm optimization algorithm; and (6) sending the low-dimension feature vector data into the multi-class classifier of the least squares support vector machine and then outputting early fault diagnosis results. The novel analog circuit early fault diagnosis method can effectively detect early faults of analog circuits.

Description

technical field [0001] The invention belongs to the fields of machine learning and electronic circuit engineering, and relates to a method for establishing an early fault diagnosis model and detecting early faults of analog circuits. Background technique [0002] Analog circuits are widely used in household appliances, industrial production lines, automobiles, aerospace and other equipment. The failure of analog circuits will cause performance degradation, functional failure, slow response and other electronic failures of the equipment. Early faults of analog circuits occur in the initial stage of faults, when the performance of the circuit is degraded but has not yet failed. Correct identification of early faults is helpful for timely maintenance of the circuit. Therefore, early fault diagnosis of analog circuits is very necessary. [0003] Aiming at fault diagnosis of analog circuits, wavelet analysis, wavelet fractal analysis (that is, fractal analysis after wavelet trans...

AI Technical Summary

Problems solved by technology

However, there is still little work on early fault diagnosis of analog circuits. The reason is that the early fault characteristics of each component are not significantly different from the characteristics of the normal circuit, and there are prone to overlaps of fault categories, which makes identification more difficult.

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