Method for forming CMOS (Complementary Metal-Oxide-Semiconductor) transistor

Abstract

The invention discloses a method for forming a CMOS (Complementary Metal-Oxide-Semiconductor) transistor. The method comprises the following steps: providing a semiconductor substrate; forming gate structures on the first region and the second region of the semiconductor substrate; forming first grooves in the semiconductor substrate on both sides of the gate structure in the first region; filling the first grooves with first stress layers; forming second grooves in the semiconductor substrate on both sides of the gate structure in the second region; filling the second grooves with second stress layers, wherein the stress types of the second stress layers are opposite to those of the first stress layers; and forming first cap layers on the surfaces of the first stress layers, and meanwhile forming second cap layers on the surfaces of the second stress layers. Through adoption of the forming method disclosed by the invention, thermal budget in the forming process of the CMOS transistor is reduced, and the reliability and electrical performance of the CMOS transistor are enhanced.

Description

technical field [0001] The invention relates to the field of semiconductor manufacturing, in particular to a method for forming a CMOS transistor. Background technique [0002] Complementary Metal-Oxide-Semiconductor (CMOS) transistors have become commonly used semiconductor devices in integrated circuits. The CMOS transistors include: P-type metal oxide semiconductor (PMOS) transistors and N-type metal oxide semiconductor (NMOS) transistors. [0003] As element density and integration of semiconductor devices increase, the gate size of PMOS transistors or NMOS transistors becomes shorter than before. However, the shortening of the gate size of the PMOS transistor or the NMOS transistor will produce a short channel effect, thereby generating a leakage current and affecting the electrical performance of the CMOS transistor. In the prior art, the carrier mobility is mainly increased by increasing the stress of the channel region of the transistor, thereby increasing the driv...

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Problems solved by technology

[0005] However, the CMOS transistors formed by the prior art have poor performance and complicated process steps

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